IP Library Assignment 013795/0722
Patent Assignment
Reel/Frame 013795/0722

Assignment of Assignor's Interest

Recorded: 2003-02-27 Pages: 9
Assignor
NEC CORPORATION
Executed: 2002-11-01
Assignee
NEC ELECTRONICS CORPORATION
1753 SHIMONUMABE, NAKAHARA-KU, KAWASAKI, KANAGAWA, 211-8668, JAPAN
Covered Property (1)
Semiconductor Device and Test Method for Manufacturing Same
Patent: 6,653,729 →
Application: 09/960,380 →
Publication: US 2002/0039801
Related Assignments (3)
Other recorded transfers of the patent in this record — the chain of ownership.
Assignment of Assignor's Interest Sep 24, 2001
From: ISHII, JUNYA
To: NEC CORPORATION
Reel/Frame 012201/0489 →
Change of Name Dec 13, 2010
From: NEC ELECTRONICS CORPORATION
To: RENESAS ELECTRONICS CORPORATION
Reel/Frame 025486/0592 →
Change of Address Nov 29, 2017
From: RENESAS ELECTRONICS CORPORATION
To: RENESAS ELECTRONICS CORPORATION
Reel/Frame 044928/0001 →