IP Library › Granted Patent US 6,815,325
Granted Patent Utility
US 6,815,325 · Confirmation No. 5980

SEMICONDUCTOR DEVICE AND TEST METHOD FOR MANUFACTURING SAME

Inventor: Junya Ishii
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2004-09-23 IFEE Issue Fee Payment (PTO-85B) 1 View
2004-07-15 LET. Miscellaneous Incoming Letter 1 View
2004-07-15 DRW Drawings-only black and white line drawings 1 View
2004-07-15 REM Applicant Arguments/Remarks Made in an Amendment 1 View
2004-07-01 NOA Notice of Allowance and Fees Due (PTOL-85) 3 View
2004-07-01 NOA Notice of Allowance and Fees Due (PTOL-85) 2 View
2004-07-01 DRW Drawings-only black and white line drawings 1 View
2004-07-01 1449 List of References cited by applicant and considered by examiner 3 View
2004-07-01 SRFW Search information including classification, databases and other search related notes 1 View
2004-07-01 IIFW Issue Information including classification, examiner, name, claim, renumbering, etc. 1 View
2004-07-01 FWCLM Index of Claims 1 View
2004-05-27 WFEE Fee Worksheet (SB06) 1 View
2003-09-12 TRNA Transmittal of New Application 4 View
2003-09-12 SPEC Specification 14 View
2003-09-12 CLM Claims 3 View
2003-09-12 ABST Abstract 1 View
2003-09-12 DRW Drawings-only black and white line drawings 4 View
2003-09-12 OATH Oath or Declaration filed 2 View
2003-09-12 A.PE Preliminary Amendment 1 View
2003-09-12 SPEC Specification 1 View
2003-09-12 CLM Claims 3 View
2003-09-12 REM Applicant Arguments/Remarks Made in an Amendment 1 View
2003-09-12 IDS Information Disclosure Statement (IDS) Form (SB08) 5 View
2003-09-12 WCLM Claims Worksheet (PTO-2022) 1 View
2003-09-12 WFEE Fee Worksheet (SB06) 1 View
2003-09-12 WFEE Fee Worksheet (SB06) 1 View
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Quick Facts
Patent No.
US 6,815,325
App. No.
10/660,753
Filed
2003-09-12
Granted
2004-11-09
Pub. No.
US20040048402A1
Examiner
LEE, CALVIN
Art Unit
2825
PTA
0 days