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App. No. 10/095,915 · Confirmation No. 2676

DEVICE AND METHOD FOR NONDESTRUCTIVE INSPECTION ON SEMICONDUCTOR DEVICE

Inventor: Kiyoshi Nikawa
Patent Expired Due to NonPayment of Maintenance Fees Under 37 CFR 1.362 View Patent ↗ View Publication ↗
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 Code Description Pages PDF
2004-03-19 IDS Information Disclosure Statement (IDS) Form (SB08) 3 View
2004-03-19 FOR Foreign Reference 4 View
2004-03-19 FOR Foreign Reference 10 View
2003-12-08 FRPR Certified Copy of Foreign Priority Application 32 View
2003-12-08 FRPR Certified Copy of Foreign Priority Application 20 View
2003-09-11 IFEE Issue Fee Payment (PTO-85B) 1 View
2003-07-18 IDS Information Disclosure Statement (IDS) Form (SB08) 5 View
2002-03-12 TRNA Transmittal of New Application 5 View
2002-03-12 A.PE Preliminary Amendment 2 View
2002-03-12 SPEC Specification 92 View
2002-03-12 CLM Claims 29 View
2002-03-12 ABST Abstract 1 View
2002-03-12 DRW Drawings-only black and white line drawings 25 View
2002-03-12 OATH Oath or Declaration filed 3 View
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Quick Facts
App. No.
10/095,915
Filed
2002-03-12
Granted
2004-07-06
Pub. No.
US20020106820A1
Art Unit
2899
PTA
0 days