Patent Application
Utility
App. No. 10/044,963
· Confirmation No. 3530
Failure analyzing device for semiconductors
Abandoned -- Failure to Respond to an Office Action
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Code | Description | Pages | ||
|---|---|---|---|---|---|
| 2002-01-15 | TRNA |
Transmittal of New Application | 2 | View | |
| 2002-01-15 | ADS |
Application Data Sheet | 4 | View | |
| 2002-01-15 | SPEC |
Specification | 69 | View | |
| 2002-01-15 | CLM |
Claims | 1 | View | |
| 2002-01-15 | ABST |
Abstract | 1 | View | |
| 2002-01-15 | DRW |
Drawings-only black and white line drawings | 23 | View | |
| 2002-01-15 | OATH |
Oath or Declaration filed | 2 | View | |
| 2002-01-15 | LET. |
Miscellaneous Incoming Letter | 1 | View |
Inventors
Sumio Ogawa
Higashihiroshima-shi, JAPAN
Minoru Ueki
Higashihiroshima-shi, JAPAN
Shinichi Hara
Shimonoseki-shi, JAPAN
Attorneys & Agents of Record
Classification
USPC
700/110
H10P74/23
H10P95/00
Prosecution
- Examiner
- RODRIGUEZ, PAUL L
- Art Unit
- 2125
- Customer No.
- 22428
- Docket No.
- 088941-0202
- Confirmation No.
- 3530
Foreign Priority
2000-087480
·
2000-03-27
·
JAPAN
Publication
- Pub. No.
- US20020059010A1
- Pub. Date
- 2002-05-16
from
NEC CORPORATION
ASSIGNMENT OF ASSIGNOR'S INTEREST
Recorded 2003-01-24
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Quick Facts
- App. No.
- 10/044,963
- Filed
- 2002-01-15
- Pub. No.
- US20020059010A1
- Examiner
- RODRIGUEZ, PAUL L
- Art Unit
- 2125
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