Patent Application
Utility
App. No. 10/061,118
· Confirmation No. 2241
Integrated circuit with bipolar transistors having different emitter base junction widths
Inventor:
Akira Sato
Abandoned -- Failure to Respond to an Office Action
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Code | Description | Pages | ||
|---|---|---|---|---|---|
| 2005-03-17 | PEFN |
Pre-Exam Formalities Notice | 2 | View | |
| 2004-09-07 | ABN |
Abandonment | 2 | View | |
| 2003-11-21 | CTAV |
Advisory Action (PTOL-303) | 3 | View | |
| 2003-11-20 | WFEE |
Fee Worksheet (SB06) | 1 | View | |
| 2003-11-20 | FWCLM |
Index of Claims | 1 | View | |
| 2003-10-30 | A.NE |
Response After Final Action | 2 | View | |
| 2003-10-30 | CLM |
Claims | 3 | View | |
| 2003-10-30 | REM |
Applicant Arguments/Remarks Made in an Amendment | 5 | View | |
| 2003-08-06 | CTFR |
Final Rejection | 6 | View | |
| 2003-08-06 | 892 |
List of references cited by examiner | 1 | View | |
| 2003-05-19 | A... |
Amendment/Request for Reconsideration-After Non-Final Rejection | 1 | View | |
| 2003-05-19 | CLM |
Claims | 2 | View | |
| 2003-05-19 | REM |
Applicant Arguments/Remarks Made in an Amendment | 6 | View | |
| 2003-02-27 | CTNF |
Non-Final Rejection | 4 | View | |
| 2003-02-27 | 892 |
List of references cited by examiner | 1 | View | |
| 2003-02-27 | 1449 |
List of References cited by applicant and considered by examiner | 1 | View | |
| 2003-02-22 | SRNT |
Examiner's search strategy and results | 3 | View | |
| 2003-01-02 | ELC. |
Response to Election / Restriction Filed | 1 | View | |
| 2002-12-04 | CTRS |
Requirement for Restriction/Election | 4 | View | |
| 2002-09-27 | C.AD |
Change of Address | 1 | View | |
| 2002-08-14 | IDS |
Information Disclosure Statement (IDS) Form (SB08) | 2 | View | |
| 2002-08-14 | FOR |
Foreign Reference | 16 | View | |
| 2002-08-14 | FOR |
Foreign Reference | 12 | View | |
| 2002-03-14 | LET. |
Miscellaneous Incoming Letter | 1 | View | |
| 2002-03-14 | DRW |
Drawings-only black and white line drawings | 9 | View | |
| 2002-03-14 | FRPR |
Certified Copy of Foreign Priority Application | 28 | View | |
| 2002-02-01 | TRNA |
Transmittal of New Application | 1 | View | |
| 2002-02-01 | SPEC |
Specification | 8 | View | |
| 2002-02-01 | CLM |
Claims | 3 | View | |
| 2002-02-01 | ABST |
Abstract | 1 | View | |
| 2002-02-01 | DRW |
Drawings-only black and white line drawings | 9 | View | |
| 2002-02-01 | OATH |
Oath or Declaration filed | 1 | View | |
| 2002-02-01 | IIFW |
Issue Information including classification, examiner, name, claim, renumbering, etc. | 1 | View | |
| 2002-02-01 | SRFW |
Search information including classification, databases and other search related notes | 1 | View | |
| 2002-02-01 | FWCLM |
Index of Claims | 1 | View | |
| 2002-02-01 | TRNA |
Transmittal of New Application | 1 | View | |
| 2002-02-01 | DRW |
Drawings-only black and white line drawings | 9 | View | |
| 2002-02-01 | SPEC |
Specification | 8 | View | |
| 2002-02-01 | CLM |
Claims | 3 | View | |
| 2002-02-01 | ABST |
Abstract | 1 | View | |
| 2002-02-01 | OATH |
Oath or Declaration filed | 1 | View | |
| 2002-02-01 | WFEE |
Fee Worksheet (SB06) | 1 | View | |
| 2002-02-01 | WFEE |
Fee Worksheet (SB06) | 1 | View | |
| 2002-02-01 | WCLM |
Claims Worksheet (PTO-2022) | 1 | View |
Inventors
Akira Sato
Yamagata, JAPAN
Attorneys & Agents of Record
Classification
USPC
257/565
H10D84/0112
H10D84/038
H10D84/641
H10D84/0121
H10D84/673
Prosecution
- Examiner
- FARAHANI, DANA
- Art Unit
- 2814
- Customer No.
- 26339
- Docket No.
- MOM-01001
- Confirmation No.
- 2241
Foreign Priority
2001-026456
·
2001-02-02
·
JAPAN
Publication
- Pub. No.
- US20020105053A1
- Pub. Date
- 2002-08-08
No related applications found.
from
NEC CORPORATION
ASSIGNMENT OF ASSIGNOR'S INTEREST
Recorded 2003-03-03
from
SATO, AKIRA
INVALID ASSIGNMENT, SEE RECORDING AT REEL 012706, FRAME 0699. (RE-RECORDED TO CORRECT THE RECORDATION DATE FROM 2-4-02 TO 2-01-02)
Recorded 2002-02-04
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Quick Facts
- App. No.
- 10/061,118
- Filed
- 2002-02-01
- Pub. No.
- US20020105053A1
- Examiner
- FARAHANI, DANA
- Art Unit
- 2814
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