High quality antialiased lines with dual sampling pattern
View Patent ↗Antialiased lines are classified according to their orientation, e.g. as x-major or y-major depending whether the x or y extent of the line is larger. Different subpixel sampling patterns are used for different lines, in accordance with this classification. This permits antialiased rendering to achieve increased visual quality of the line without adding in more sample points.
1. A method for generating antialiased lines in a computer graphics system, comprising the actions of:
for each respective line, determining which of a plurality of orientation classes that entire line falls into; and
performing subpixel sampling using one of a plurality of multi-point sampling patterns, in dependence on which of said plurality of orientation classes that line falls into;
displaying at least one of the respective lines.
2. The method of claim 1 , wherein said classes consist of x-major and y-major.
3. The method of claim 2 , wherein said classification of x-major and y-major depends on whether the x or y extent of the line is larger.
4. The method of claim 1 , wherein said orientation classes correspond one-to-one to said sampling patterns.
5. A graphics processor which is configured to implement the method of claim 1 .
6. The method of claim 1 , wherein said sampling patterns have the same number of sub-pixel sampling points.
7. The method of claim 1 , wherein said sampling patterns have four sub-pixel sampling points.
8. A method for antialiased rendering in a computer graphics system, comprising the actions of:
(a) identifying, for at least one respective entire line, which one of a limited number of directions is most nearly parallel to said line; and
(b) performing subpixel sampling on said line with a subpixel multi-point sampling pattern which has maximal resolution approximately normal to said one direction;
(c) displaying said line.
9. The method of claim 8 , wherein said number of directions is two.
10. A graphics processor which is configured to implement the method of claim 8 .
11. The method of claim 8 , wherein said sampling pattern has four sub-pixel sampling points.
12. A computer graphics system for generating antialiased lines comprising:
means for determining which of a plurality of orientation classes an entire line falls into; and
means for performing subpixel sampling using one of a plurality of multi-point sampling patterns, in dependence on which of said plurality of orientation classes that line falls into.
13. The system of claim 12 , wherein said classes consist of x-major and y-major.
14. The system of claim 13 , wherein said classification of x-major and y-major depends on whether the x or y extent of the line is larger.
15. The system of claim 12 , wherein said orientation classes correspond one-to-one to said sampling patterns.
16. The system of claim 12 , wherein said sampling patterns have the same number of sub-pixel sampling points.
17. The system of claim 12 , wherein said sampling patterns have four sub-pixel sampling points.
18. A computer graphics system for generating antialiased lines comprising:
means for identifying, for all of at least one respective line, which one of a limited number of directions is most nearly parallel to said line; and
means for performing subpixel sampling on said line with a subpixel multi-point sampling pattern which has maximal resolution approximately normal to said one direction.
19. The system of claim 18 , wherein said number of directions is two.
20. The system of claim 18 , wherein said sampling pattern has four sub-pixel sampling points.
21. A method for generating antialiased lines in a computer graphics system, comprising the steps of for each respective line:
determining which of a plurality of orientation classes that entire line falls into; and
performing subpixel sampling using one of a plurality of multi-point sampling patterns, in dependence on which of said plurality of orientation classes that line falls into;
displaying at least one of the respective lines.
22. The method of claim 21 , wherein said classes consist of x-major and y-major.
23. The method of claim 22 , wherein said classification of x-major and y-major depends on whether the x or y extent of the line is larger.
24. The method of claim 21 , wherein said orientation classes correspond one-to-one to said sampling patterns.
25. The method of claim 21 , wherein said sampling patterns have the same number of sub-pixel sampling points.
26. The method of claim 21 , wherein said sampling patterns have four sub-pixel sampling points.
27. A method for generating antialiased lines in a computer graphics system, comprising the actions of:
identifying, for at least, one respective entire line, which one of a limited of directions is most nearly parallel to said line; and
performing subpixel sampling on said line with a subpixel multi-point sampling pattern which has maximal resolution approximately normal to said one direction;
displaying at least one of the respective lines.
28. The method of claim 27 , wherein said number of directions is two.
29. The method of claim 27 , wherein said sampling pattern has four sub-pixel sampling points.