IP Library › Granted Patent US 7,112,926
Granted Patent B2
US 7,112,926 · App. 10/120,526 · Granted Sep 26, 2006

Matching unit and plasma processing system

Assignees: Tokyo Electron Limited; Tokyo Hy-Power Labs, Inc.
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Quick Facts
Patent No.
US 7,112,926
App. No.
10/120,526
Granted
Sep 26, 2006
Kind
B2
Abstract

There are provided a matching unit capable of sufficiently matching the impedance of a high frequency load to a transmission path impedance without increasing its size and matching time even if a high frequency power of 70 MHz or higher is supplied thereto, and a plasma processing system using the same. A matching unit 41 comprises: a resonance rod 61 for transmitting a high frequency energy from a high frequency power supply 40 to a plasma producing electrode; a variable capacitor 62 , connected to the resonance rod 61 and an electrode 21 in series, for adjusting the imaginary part of an impedance complex number; a housing 63 which is provided outside of the resonance rod 61 and which is grounded; a link coil 64 for exciting a high frequency energy to the resonance rod 61 and for adjusting the real part of the impedance complex number; and a controller 69 for controlling a driving part for the variable capacitor 62 and the link coil 64 so that a series resonance circuit is formed between the high frequency power supply 40 and the ground via plasma in a matching state.

Claims (48)

1. A matching unit, provided between a high frequency power supply and a high frequency load introducing part, for matching an impedance of a high frequency load with a transmission path impedance, said matching unit comprising:

a resonance rod for transmitting a high frequency energy from a high frequency power supply to a high frequency load introducing part;

a variable capacitor, connected to said resonance rod and said high frequency load introducing part in series, for adjusting an imaginary part of an impedance complex number;

a housing which is provided outside of said resonance rod and which is grounded; and

a variable coupling feeding part for exciting a high frequency energy to said resonance rod and for adjusting a real part of the impedance complex number,

wherein said variable capacitor and said variable coupling feeding part are adjusted so that a series resonance circuit is formed between said high frequency power supply and said high frequency load in a state that the impedance of said high frequency load is matched with the transmission path impedance.

2. A matching unit as set forth in claim 1 , wherein said high frequency load introducing part is a plasma producing electrode, and said high frequency load is plasma.

3. A matching unit as set forth in claim 1 , which further comprises control means for controlling said variable capacitor and said variable coupling feeding part.

4. A matching unit as set forth in claim 1 , wherein said resonance rod and said housing are provided so as to be coaxial with each other.

5. A matching unit as set forth in claim 1 , wherein said variable coupling feeding part has a link coil for supplying a high frequency power to said resonance rod by the inductive coupling.

6. A matching unit as set forth in claim 5 , wherein said variable coupling feeding part adjusts impedance by adjusting the distance between said link coil and said resonance rod.

7. A matching unit as set forth in claim 5 , wherein said variable coupling feeding part has a variable capacitor which is connected to said link coil, and adjusts impedance by adjusting said variable capacitor.

8. A matching unit as set forth in claim 7 , wherein said link coil is cylindrical, and is provided so as to surround said resonance rod.

9. A matching unit as set forth in claim 1 , wherein said variable coupling feeding part has a connection member which is movably connected to said resonance rod and which supplies a high frequency power to said resonance rod, and a moving mechanism for moving a connection member in longitudinal directions of said resonance rod, said variable coupling feeding part adjusting a real part of an impedance complex number by adjusting the position of said connection member by said moving mechanism.

10. A matching unit as set forth in claim 1 , wherein said variable coupling feeding part has a connection member which is movably connected to said resonance rod and which supplies a high frequency power to said resonance rod, and a variable capacitor which is arranged in series to said connection member, said variable coupling feeding part adjusting a real part of an impedance complex number by adjusting said variable capacitor.

11. A matching unit as set forth in claim 1 , wherein said variable capacitor connected to said resonance rod and said high frequency load introducing part in series has a motor for changing the capacitance of said variable capacitor, said motor being provided on the side of the other end via a rotation shaft provided in said resonance rod.

12. A matching unit as set forth in claim 1 , wherein said high frequency power supply has a frequency of 70 MHz or higher.

13. A matching unit as set forth in claim 1 , wherein said variable capacitor connected to said resonance rod and said high frequency load introducing part in series is mounted directly on said plasma producing electrode.

14. A matching unit as set forth in claim 13 , wherein said variable capacitor is detachably mounted by a multi-plane contact member having a plurality of contacts.

15. A matching unit as set forth in claim 13 , wherein said variable capacitor has a structure that one electrode of said variable capacitor serves as a part of said plasma producing electrode and that the other electrode is provided via air serving as an insulating layer.

16. A matching unit, provided between a high frequency power supply and a plasma producing electrode, for matching an impedance of a high frequency load with a transmission path impedance, said matching unit being mounted directly on said plasma producing electrode,

said matching unit having a variable capacitor for adjusting an imaginary part of an impedance complex number of a high frequency load, said variable capacitor being mounted directly on said plasma producing electrode.

17. A matching unit as set forth in claim 16 , wherein said variable capacitor being detachably mounted by a multi-plane contact member has a plurality of contacts.

18. A matching unit as set forth in claim 16 , wherein said variable capacitor has a structure that one electrode of said variable capacitor serves as a part of said plasma producing electrode and that the other electrode is provided via air serving as an insulating layer.

19. A plasma processing system comprising:

a chamber for housing therein an object to be processed;

first and second electrodes which are provided so as to face each other in said chamber;

a high frequency power supply for supplying a high frequency power to said first electrode;

a matching unit, provided between said high frequency power supply and said first electrode, for matching a plasma impedance with a transmission path impedance;

exhaust means for maintaining the interior of said chamber in a predetermined reduced pressure state; and

process gas feed means for feeding a process gas into said chamber,

said plasma processing system forming a high frequency electric field between said first and second electrodes by said high frequency power to produce the plasma of said process gas to carry out a plasma processing,

said matching unit comprising:

a resonance rod for transmitting a high frequency energy from said high frequency power to said first electrode;

a variable capacitor, connected to said resonance rod and said first electrode in series, for adjusting an imaginary part of an impedance complex number;

a housing which is provided outside of said resonance rod and which is grounded; and

a variable coupling feeding part for exciting a high frequency energy to said resonance rod and for adjusting a real part of the impedance complex number,

wherein said variable capacitor and said variable coupling feeding part are adjusted so that a series resonance circuit is formed between said high frequency power and the ground via said plasma in a state that the impedance of a high frequency load is matched with a transmission path impedance.

20. A plasma processing system as set forth in claim 19 , wherein said high frequency power supply has a frequency of 70 MHz or higher.

21. A plasma processing system comprising:

a chamber for housing therein an object to be processed;

first and second electrodes which are provided so as to face each other in said chamber;

a high frequency power supply for supplying a high frequency power to said first electrode;

a matching unit, provided between said high frequency power supply and said first electrode, for matching a plasma impedance with a transmission path impedance;

exhaust means for maintaining the interior of said chamber in a predetermined reduced pressure state; and

process gas feed means for feeding a process gas into said chamber,

said plasma processing system forming a high frequency electric field between said first and second electrodes by said high frequency power to produce the plasma of said process gas to carry out a plasma processing,

said matching unit being mounted directly on said first electrode and having a variable capacitor for adjusting an imaginary part of an impedance complex number of high frequency load, said variable capacitor being mounted directly on said first electrode.

Assignments (3)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Mar 28, 2014
From: TOKYO HY-POWER LABS, INC.
To: TOKYO ELECTRON LIMITED
Reel/Frame 032550/0591 →
RE-RECORD TO ADD THE SECOND RECEIVING PARTY. PREVIOUSLY RECORDED AT REEL 012789, FRAME 0412. Recorded Jul 22, 2002
From: HIMORI, SHINJI; YUASA, MITSUHIRO; WATANABE, KAZUYOSHI; SHIMADA, JUNICHI
To: TOKYO ELECTRON LIMITED; TOKYO HY-POWER LABS, INC.
Reel/Frame 013126/0112 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Apr 12, 2002
From: HIMORI, SHINJI; YUASA, MITSUHIRO; WATANABE, KAZUYOSHI; SHIMADA, JUNICHI
To: TOKYO ELECTRON LIMITED
Reel/Frame 012789/0412 →
Priority Claims (1)
JP 11-294527 · Oct 15, 1999 · national
Continuity (2)
Continuation In Part PCTJP000708300 · Oct 12, 2000
Related Publication 20020134508A1 · Sep 26, 2002