Amorphous soft underlayers for perpendicular recording media
View Patent ↗A perpendicular magnetic recording medium having a substrate, an amorphous soft underlayer and a magnetic layer for perpendicular recording has reduced DC noise and surface roughness, which reduces the head-to-media spacing and the head-to-amorphous soft underlayer spacing.
1. A method for writing data in a perpendicular recording medium, comprising interposing an amorphous soft underlayer between a substrate and a magnetic recording layer for perpendicular recording, and writing data in the magnetic recording layer, wherein the amorphous soft underlayer reduces DC noise in the perpendicular recording medium, wherein the amorphous soft underlayer comprises FeCoB, and further wherein the amorphous soft underlayer has an average surface roughness (Ra) of less than 0.3 nm, wherein the amorphous soft underlayer is thicker than the magnetic recording layer.
2. The method of claim 1 , wherein the amorphous soft underlayer has a thickness of about 100 to about 400 nm.
3. The method of claim 1 , wherein the amorphous soft underlayer comprises a material that exhibits no peak in an X-ray diffraction pattern as compared to background noise.
4. The method of claim 1 , wherein the amorphous soft underlayer comprises nanocrystallites in an amorphous phase.
5. The method of claim 1 , wherein the amorphous soft underlayer comprises FeCoB z , wherein z is about 10 to 15.
6. The method of claim 1 , further comprising measuring DC noise of the perpendicular recording medium.
7. A magnetic recording medium, comprising a substrate, an amorphous soft underlayer and a magnetic layer for perpendicular recording, wherein the amorphous soft underlayer comprises a material selected from the group consisting of CoFeZr, FeCoZrB, FeCoB and combinations thereof, further the amorphous soft underlayer has a thickness of about 100 to about 400 nm, wherein the amorphous soft underlayer is thicker than the magnetic recording layer, further wherein the amorphous soft underlayer has an average surface roughness (Ra) of less than 0.3 nm.
8. A magnetic recording medium, comprising a substrate, an amorphous soft underlayer and a magnetic layer for perpendicular recording, wherein the amorphous soft underlayer comprises FeCoB, and further wherein the amorphous soft underlayer has an average surface roughness (Ra) of less than 0.3 nm, wherein the amorphous soft underlayer is thicker than the magnetic recording layer.
9. The medium of claim 7 , wherein the amorphous soft underlayer comprises a material that exhibits no peak in an X-ray diffraction pattern as compared to background noise.
10. The medium of claim 7 , wherein the amorphous soft underlayer comprises nanocrystallites in an amorphous phase.
11. The medium of claim 7 , wherein the amorphous soft underlayer comprises a material selected from the group consisting of FeCoB z , wherein z is about 10 to 15.
12. A magnetic recording medium, comprising a substrate, an amorphous soft underlayer and a magnetic layer for perpendicular recording, wherein the amorphous soft underlayer comprises a material selected from the group consisting of CoFeZr, FeCoZrB, FeCoB and combinations thereof, wherein the amorphous soft underlayer is thicker than the magnetic recording layer, further wherein the amorphous soft underlayer has an average surface roughness (Ra) of less than 0.3 nm.
13. The medium of claim 1 , wherein the amorphous soft underlayer comprises nanocrystallites in an amorphous phase.
14. The medium of claim 8 , wherein the amorphous soft underlayer comprises nanocrystallites in an amorphous phase.
15. The medium of claim 12 , wherein the amorphous soft underlayer comprises nanocrystallites in an amorphous phase.