Micro power micro-sized CMOS active pixel

1. A method of operating a pixel unit of an imaging device, said method comprising:

resetting a charge accumulation region with a reset pulse having a voltage greater than an operating voltage of said imaging device;

accumulating charge provided by a photoreceptor at said charge accumulation region; and

selectively outputting a signal based on the charge at said accumulation region produced by said photoreceptor.

2. The method of claim 1 , wherein the reset pulse comprises an output voltage of a booster circuit.

3. The method of claim 1 , further comprising applying said reset pulse to a gate and one of a source/drain region of a reset transistor, and resetting said charge accumulation region by a signal produced at the other of said source/drain region of said reset transistor.

4. The method of claim 1 , wherein said selectively outputting comprises selectively applying a select signal to a gate and one of a source/drain terminal of a select transistor, the other of said source/drain terminal providing an operating voltage for an output transistor having a gate coupled to receive a signal from said charge accumulation region.

5. The method of claim 4 , wherein said select signal has a voltage greater than said operating voltage of said imaging device.

6. An integrated circuit, comprising:

a charge accumulating region on said integrated circuit, said region receiving accumulated charge therein;

a photoreceptor, coupled to said charge accumulating region, for changing an amount of charge therein based on an applied image signal;

a reset transistor, having a drain and gate terminal coupled together, said reset transistor activating to provide a reset pulse to said charge accumulation region; and

a select transistor, having a drain and gate terminal coupled together, and coupled to selectively cause the production of an output signal based on the charges at said charge accumulation region.

7. The integrated circuit of claim 6 , further comprising a source follower transistor, having a gate coupled to said charge accumulation region and one source/drain region coupled to said transistor and another source/drain region providing said output signal.

8. The integrated circuit of claim 6 , wherein the reset pulse has a voltage greater than an operating voltage of the integrated circuit.

9. The integrated circuit of claim 6 , wherein the select transistor receives a select signal at a gate and one of a source/drain terminal, the other of said source/drain terminal providing the operating voltage for an output transistor having a gate coupled to said charge accumulation region.

10. The integrated circuit of claim 9 , wherein the select signal has a voltage greater than an operating voltage of the integrated circuit.