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App. No. 10/153,014 · Confirmation No. 7025

Scan path test method

Inventor: Hisashi Yamauchi
Abandoned -- Failure to Respond to an Office Action View Publication ↗
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 Code Description Pages PDF
2006-01-24 ABN Abandonment 2 View
2005-02-24 CTNF Non-Final Rejection 13 View
2005-02-24 1449 List of References cited by applicant and considered by examiner 1 View
2005-02-24 892 List of references cited by examiner 1 View
2005-02-24 BIB Bibliographic Data Sheet 1 View
2005-02-24 SRFW Search information including classification, databases and other search related notes 1 View
2005-02-24 FWCLM Index of Claims 1 View
2005-02-12 SRNT Examiner's search strategy and results 3 View
2002-05-21 TRNA Transmittal of New Application 1 View
2002-05-21 SPEC Specification 28 View
2002-05-21 CLM Claims 6 View
2002-05-21 ABST Abstract 1 View
2002-05-21 DRW Drawings-only black and white line drawings 8 View
2002-05-21 OATH Oath or Declaration filed 3 View
2002-05-21 WFEE Fee Worksheet (SB06) 1 View
2002-05-21 WFEE Fee Worksheet (SB06) 1 View
2002-05-21 WCLM Claims Worksheet (PTO-2022) 1 View
2002-05-21 FRPR Certified Copy of Foreign Priority Application 40 View
2002-05-21 IDS Information Disclosure Statement (IDS) Form (SB08) 3 View
2002-05-21 FOR Foreign Reference 37 View
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Quick Facts
App. No.
10/153,014
Filed
2002-05-21
Pub. No.
US20020199144A1
Art Unit
2138