Methods and apparatus for delay circuit

1. A memory having a deskewing circuit, comprising:

a delay monitor circuit configured to generate a delayed input signal in response to an initial input signal;

a measure delay line connected to the delay monitor circuit and configured to receive the delayed input signal and generate a measured delay signal according to the delayed input signal;

an intermediate element connected to the measure delay line and configured to receive the measured delay signal;

a variable delay line connected to the intermediate element and configured to receive the measured delay signal through said intermediate element; and

an operation control circuit connected to at least one of the measure delay line, the intermediate element, and the variable delay line, and configured to detect an entry point in the measured delay signal, comprising:

an overflow circuit configured to adjust an overflow signal according to a detection of the entry point; and

a clock select circuit configured to terminate a clock signal to a selected portion of the at least one of the measure delay line, the intermediate element, and the variable delay line according to the detection of the entry point.

2. A memory having a deskewing circuit according to claim 1 , wherein:

the measure delay line is configured to generate a status signal upon the detection of the entry point; and

the overflow circuit is configured to receive the status signal and adjust the overflow signal in response to the status signal.

3. A memory having a deskewing circuit according to claim 1 , wherein;

the intermediate element comprises more than one stage; and

the overflow signal comprises an output signal provided by one of the intermediate element stages.

4. A memory having a deskewing circuit according to claim 3 , wherein the overflow circuit is configured to store a selected value in the intermediate element state that provides the output signal.

5. A memory having a deskewing circuit according to claim 1 , wherein the operation control circuit is configured to:

receive output signals from the intermediate element; and

provide a selected output to the variable delay line according to the detection of the entry point.

6. A memory having a deskewing circuit according to claim 5 , wherein:

variable delay line includes more than one stage; and

the operation control circuit is configured to:

provide a first selected output to a first set of the variable delay line stages and a second selected output to a second set of the variable delay line stages according to the detection of the entry point.

7. A memory having a deskewing circuit according to claim 1 , wherein:

the overflow circuit is configured to generate a clock control signal upon the detection of the entry point in the measured delay signal; and

the clock select circuit is configured to terminate the clock signal to the selected portion of the at least one of the measure delay line, the intermediate element, and the variable delay line in response to the clock control signal.

8. A memory having a deskewing circuit according to claim 1 , wherein:

the at least one of the measure delay line, the intermediate element, and the variable delay line comprises more than one output stage; and

the clock select circuit comprises more than one control stage, wherein each clock select circuit control stage is connected to a corresponding output stage.

9. A memory having a deskewing circuit according to claim 1 , wherein the clock select circuit is configured to receive the measured delay signal from the intermediate element, detect the entry point in the measured delay signal, and terminate the clock signal to the selected portion of the variable delay line according to the detection of the entry point.

10. An electronic system, comprising:

a processor;

a clock generator connected to the processor and configured to generate a clock signal; and

a memory connected to the processor and the clock generator and including a deskewing circuit, wherein the deskewing circuit comprises:

a delay measuring circuit configured to receive the clock signal and a delayed input signal and generate a measured delay signal; and

an operation control circuit having a component and configured to perform at least one of the following functions: (a) detect an overflow condition in the measured delay signal and adjust an overflow signal, and (b) detect an entry point in the measured delay signal and terminate the clock signal to the component, wherein the delay measuring circuit includes a measure delay line configured to generate a status signal upon the detection of the entry point; and the operation control circuit is configured to receive the status signal and adjust the overflow signal in response to the status signal.

11. An electronic system, comprising:

a processor;

a clock generator connected to the processor and configured to generate a clock signal; and

a memory connected to the processor and the clock generator and including a deskewing circuit, wherein the deskewing circuit comprises;

a delay measuring circuit configured to receive the clock signal and a delayed input signal and generate a measured delay signal; and

an operation control circuit having a component and configured to perform at least one at the following functions: (a) detect an overflow condition in the measured delay signal and adjust an overflow signal, and (b) detect an entry point in the measured delay signal and terminate the clock signal to the component, wherein the memory includes an intermediate element having more than one stage; and the overflow signal comprises an output signal provided by one of the intermediate element stages.

12. An electronic system according to claim 11 , wherein the overflow circuit is configured to store a selected value in the intermediate element stage that provides the output signal.