Multi-chip package type semiconductor device
View Patent ↗A multi-chip package type semiconductor device includes an insulating substrate having first and second conductive patterns thereon, a first semiconductor chip on the insulating substrate and having a first terminal pad and a relay pad isolated from the first terminal pad. The device further includes a second semiconductor chip on the first semiconductor chip having a second terminal pad. The first semiconductor chip is connected to the first pattern by a first bonding wire. The second semiconductor chip is connected to the second pattern by a second bonding wire, which connects the second pattern to the relay pad, and a third bonding wire, which connects the relay pad to the second terminal pad. The lengths of the first, second and third bonding wire are approximately the same.
1. A multi-chip package type semiconductor device, comprising:
a first semiconductor chip having a first electrode pad;
a second semiconductor chip mounted on the first semiconductor chip, the second semiconductor chip having a second electrode pad;
an internal electrode;
a first bump formed on the first electrode pad;
a second bump formed on the second electrode pad;
a third bump formed on the first bump;
a first wire which includes a first bond made on the internal electrode and a second bond made on the first bump, wherein the first wire extends between the internal electrode and a place between the first and third bumps; and
a second wire which includes a first bond made on the third bump and a second bond made on the second bump, wherein the second wire extends between tops of the third bump and the second bump.
2. A multi-chip package type semiconductor device, as claimed in claim 1 , further comprising an insulating substrate, wherein the internal electrode is formed on the insulating substrate, and the first semiconductor chip is placed on the insulating substrate.
3. A multi-chip package type semiconductor device, as claimed in claim 1 , wherein the first bond of the first wire is made prior to the second bond of the first wire, and wherein the first bond of the second wire is made prior to the second bond of the second wire.
4. A multi-chip package type semiconductor device, as claimed in claim 3 , wherein the first wire is provided prior to the second wire.
5. A multi-chip package type semiconductor device, as claimed in claim 1 , wherein the second wire has a straight portion being vertically located nearby the top of the third bump.
6. A multi-chip package type semiconductor device, comprising:
a first semiconductor chip having a first electrode pad;
a second semiconductor chip mounted on the first semiconductor chip, the second semiconductor chip having a second electrode pad;
an internal electrode;
a bump formed on the first electrode pad;
a first wire which includes a first bond made on the internal electrode and a second bond made on the bump, wherein the first wire extends between the internal electrode and the bump; and
a second wire which includes a first bond made on the second electrode pad and a second bond made on the bump, wherein the second wire extends between tops of the bump and the second electrode pad.
7. A multi-chip package type semiconductor device, as claimed in claim 6 , further comprising an insulating substrate, wherein the internal electrode is formed on the insulating substrate, and the first semiconductor chip is placed on the insulating substrate.
8. A multi-chip package type semiconductor device, as claimed in claim 6 , wherein the first bond of the first wire is made prior to the second bond of the first wire, and wherein the first bond of the second wire is made prior to the second bond of the second wire.
9. A multi-chip package type semiconductor device, as claimed in claim 8 , wherein the first wire is provided prior to the second wire.
10. A multi-chip package type semiconductor device, as claimed in claim 8 , wherein the second wire is provided prior to the first wire.
11. A multi-chip package type semiconductor device, as claimed in claim 6 , wherein the second wire has a straight portion being vertically located nearby the top of the bump.