Granted Patent
Utility
US 6,815,148
· Confirmation No. 6349
METHOD OF MANUFACTURING A SEMICONDUCTOR DEVICE AND DESIGNING A MASK PATTERN
Inventor:
Akira Matsumoto
|
⬇ PDF
|
Code | Description | Pages | ||
|---|---|---|---|---|---|
| 2004-09-29 | IFEE |
Issue Fee Payment (PTO-85B) | 1 | View | |
| 2004-07-01 | NOA |
Notice of Allowance and Fees Due (PTOL-85) | 3 | View | |
| 2004-07-01 | NOA |
Notice of Allowance and Fees Due (PTOL-85) | 3 | View | |
| 2004-07-01 | IIFW |
Issue Information including classification, examiner, name, claim, renumbering, etc. | 1 | View | |
| 2004-07-01 | FWCLM |
Index of Claims | 1 | View | |
| 2004-07-01 | SRFW |
Search information including classification, databases and other search related notes | 1 | View | |
| 2004-05-20 | A... |
Amendment/Request for Reconsideration-After Non-Final Rejection | 5 | View | |
| 2004-05-20 | CLM |
Claims | 4 | View | |
| 2004-05-20 | REM |
Applicant Arguments/Remarks Made in an Amendment | 2 | View | |
| 2004-02-17 | CTNF |
Non-Final Rejection | 5 | View | |
| 2004-02-17 | 1449 |
List of References cited by applicant and considered by examiner | 1 | View | |
| 2004-02-17 | 892 |
List of references cited by examiner | 1 | View | |
| 2004-02-17 | FWCLM |
Index of Claims | 1 | View | |
| 2004-02-17 | SRFW |
Search information including classification, databases and other search related notes | 1 | View | |
| 2004-02-09 | SRNT |
Examiner's search strategy and results | 1 | View | |
| 2003-11-24 | ELC. |
Response to Election / Restriction Filed | 1 | View | |
| 2003-10-22 | CTRS |
Requirement for Restriction/Election | 4 | View | |
| 2003-10-22 | FWCLM |
Index of Claims | 1 | View | |
| 2003-04-03 | C.AD |
Change of Address | 1 | View | |
| 2002-06-18 | TRNA |
Transmittal of New Application | 2 | View | |
| 2002-06-18 | ADS |
Application Data Sheet | 2 | View | |
| 2002-06-18 | SPEC |
Specification | 19 | View | |
| 2002-06-18 | CLM |
Claims | 6 | View | |
| 2002-06-18 | ABST |
Abstract | 1 | View | |
| 2002-06-18 | DRW |
Drawings-only black and white line drawings | 6 | View | |
| 2002-06-18 | OATH |
Oath or Declaration filed | 4 | View | |
| 2002-06-18 | WFEE |
Fee Worksheet (SB06) | 1 | View | |
| 2002-06-18 | WFEE |
Fee Worksheet (SB06) | 1 | View | |
| 2002-06-18 | IDS |
Information Disclosure Statement (IDS) Form (SB08) | 3 | View | |
| 2002-06-18 | FOR |
Foreign Reference | 14 | View | |
| 2002-06-18 | FOR |
Foreign Reference | 11 | View | |
| 2002-06-18 | FRPR |
Certified Copy of Foreign Priority Application | 22 | View |
Inventors
Akira Matsumoto
Tokyo, JAPAN
Attorneys & Agents of Record
Classification
USPC
430/313
H10P50/73
H10P76/00
H10W20/084
Prosecution
- Examiner
- DUDA, KATHLEEN
- Art Unit
- 1756
- Customer No.
- 22428
- Docket No.
- 016891-0848
- Confirmation No.
- 6349
Foreign Priority
2001-185976
·
2001-06-20
·
JAPAN
Publication
- Pub. No.
- US20020197567A1
- Pub. Date
- 2002-12-26
Patent Term Adjustment
-3days
No related applications found.
CHANGE OF ADDRESS
Recorded 2017-11-29
from
NEC CORPORATION
ASSIGNMENT OF ASSIGNOR'S INTEREST
Recorded 2003-02-19
Monitor This Case
Get email alerts when status or documents change.
Order Certified Copies
Most orders are placed with the USPTO same day — all within 24 business hours.
Order via The Patent Place →
Pre-filled with this application's details
Quick Facts
- Patent No.
- US 6,815,148
- App. No.
- 10/173,037
- Filed
- 2002-06-18
- Granted
- 2004-11-09
- Pub. No.
- US20020197567A1
- Examiner
- DUDA, KATHLEEN
- Art Unit
- 1756
- PTA
- -3 days
External Links