IP Library Granted Patent US 6,800,403
Granted Patent Utility
US 6,800,403 · Confirmation No. 8318

TECHNIQUES TO CHARACTERIZE ISO-DENSE EFFECTS FOR MICRODEVICE MANUFACTURE

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2004-05-06 A... Amendment/Request for Reconsideration-After Non-Final Rejection 2 View
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2004-03-03 CTNF Non-Final Rejection 5 View
2004-03-03 1449 List of References cited by applicant and considered by examiner 3 View
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2002-06-18 SPEC Specification 13 View
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Quick Facts
Patent No.
US 6,800,403
App. No.
10/175,367
Filed
2002-06-18
Granted
2004-10-05
Pub. No.
US20030232253A1
Art Unit
1756
PTA
0 days