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App. No. 10/175,845 · Confirmation No. 5396

Semiconductor memory device capable of failure analysis with system in operation

Abandoned -- Failure to Respond to an Office Action View Publication ↗
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 Code Description Pages PDF
2005-12-12 ABN Abandonment 2 View
2005-03-23 CTNF Non-Final Rejection 12 View
2005-03-23 1449 List of References cited by applicant and considered by examiner 1 View
2005-03-23 892 List of references cited by examiner 1 View
2005-03-23 BIB Bibliographic Data Sheet 1 View
2005-03-23 FWCLM Index of Claims 1 View
2005-03-23 SRFW Search information including classification, databases and other search related notes 1 View
2005-03-09 SRNT Examiner's search strategy and results 2 View
2003-03-24 IMIS Miscellaneous Internal Document 1 View
2002-08-01 IMIS Miscellaneous Internal Document 1 View
2002-06-21 TRNA Transmittal of New Application 2 View
2002-06-21 SPEC Specification 31 View
2002-06-21 CLM Claims 4 View
2002-06-21 ABST Abstract 1 View
2002-06-21 DRW Drawings-only black and white line drawings 11 View
2002-06-21 OATH Oath or Declaration filed 3 View
2002-06-21 WFEE Fee Worksheet (SB06) 1 View
2002-06-21 WFEE Fee Worksheet (SB06) 1 View
2002-06-21 FRPR Certified Copy of Foreign Priority Application 62 View
2002-06-21 IDS Information Disclosure Statement (IDS) Form (SB08) 3 View
2002-06-21 FOR Foreign Reference 7 View
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Quick Facts
App. No.
10/175,845
Filed
2002-06-21
Pub. No.
US20030115528A1
Art Unit
2138