IP Library › Granted Patent US 6,759,864
Granted Patent Utility
US 6,759,864 · Confirmation No. 8661

SYSTEM AND METHOD FOR TESTING INTEGRATED CIRCUITS BY TRANSIENT SIGNAL ANALYSIS

Inventor: Chintan Patel
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Quick Facts
Patent No.
US 6,759,864
App. No.
10/176,321
Filed
2002-06-20
Granted
2004-07-06
Pub. No.
US20030234658A1
Art Unit
2829
PTA
0 days