IP Library Granted Patent US 7,098,878
Granted Patent B2
US 7,098,878 · App. 10/205,414 · Granted Aug 29, 2006

Semiconductor device and liquid crystal panel driver device

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Quick Facts
Patent No.
US 7,098,878
App. No.
10/205,414
Granted
Aug 29, 2006
Kind
B2
Abstract

A semiconductor device carries out a test utilizing contact with a probe needle without being affected by narrowing of the pitch at which output pads are arranged. The device is equipped with test circuits provided between a plurality of output buffers via which signals are output and output pads corresponding thereto. The test circuit includes output switches caused to sequentially make connections by a controller in test and interpad switches involved in making connections of the output pads with a test pad by the controller in test. In test, probe needles are brought into contact with the test pad. The output pads are not used in test, and can be arranged at a narrowed pitch. Thus, the chip area can be reduced and are therefore so that the pitch for the output pads can be narrowed and the chip area can be decreased.

Claims (7)

1. A liquid cristal driver device comprising:

a plurality of drive circuits for driving pixels of a liquid crystal panel; a plurality of output pads corresponding to the drive circuits;

a plurality of input pads used in test mode;

a test pad disposed in line with the input pads;

a plurality of output switches, one for each adjacent pair of nth and (n×1)th driver circuits, providing three operating states of: (a) connecting outputs of the nth and (n+1)th driver circuits straight to the nth and (n×1)th output pads, respectively, (b) cross-connecting the outputs of the nth and (n×1)th driver circuits to the (n×1)th and nth output pads, respectively, and (c) disconnecting the (n×1)th and nth output pads from the nth and (n×1)th driver circuits;

interpad switches connecting every other output pad to the test pad in test mode; and

a controller sequentially making connections via the output switches in the test mode, wherein the controller in the test mode causes the outputs of each adjacent pair of driver circuits to appear one by one at the test pad by setting the corresponding output switch to the operating state (a) or (b) while maintaining the other output switches in the operating state (c).

Assignments (9)
RELEASE OF SECURITY INTEREST Recorded Mar 16, 2022
From: MUFG UNION BANK, N.A.
To: CYPRESS SEMICONDUCTOR CORPORATION; SPANSION LLC
Reel/Frame 059410/0438 →
CORRECTIVE ASSIGNMENT TO CORRECT THE 8647899 PREVIOUSLY RECORDED ON REEL 035240 FRAME 0429. ASSIGNOR(S) HEREBY CONFIRMS THE SECURITY INTERST. Recorded Nov 3, 2020
From: CYPRESS SEMICONDUCTOR CORPORATION; SPANSION LLC
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 058002/0470 →
ASSIGNMENT AND ASSUMPTION OF SECURITY INTEREST IN INTELLECTUAL PROPERTY Recorded Oct 28, 2019
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: MUFG UNION BANK, N.A.
Reel/Frame 050896/0366 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jun 30, 2015
From: SPANSION, LLC
To: CYPRESS SEMICONDUCTOR CORPORATION
Reel/Frame 036039/0001 →
SECURITY INTEREST Recorded Mar 21, 2015
From: CYPRESS SEMICONDUCTOR CORPORATION; SPANSION LLC
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 035240/0429 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Sep 11, 2013
From: FUJITSU SEMICONDUCTOR LIMITED
To: SPANSION LLC
Reel/Frame 031205/0461 →
CHANGE OF NAME Recorded Jul 22, 2010
From: FUJITSU MICROELECTRONICS LIMITED
To: FUJITSU SEMICONDUCTOR LIMITED
Reel/Frame 024982/0245 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Dec 12, 2008
From: FUJITSU LIMITED
To: FUJITSU MICROELECTRONICS LIMITED
Reel/Frame 021998/0645 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jul 26, 2002
From: UDO, SHINYA; KUMAGAI, MASAO; KOKUBUN, MASATOSHI; NISHIZAWA, HIDEKAZU; SHIGIHARA, TAKEO
To: FUJITSU LIMITED
Reel/Frame 013134/0651 →