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App. No. 10/212,217 · Confirmation No. 2840

Methods utilizing scanning probe microscope tips and products therefor or produced thereby

Abandoned -- Failure to Respond to an Office Action View Publication ↗
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 Code Description Pages PDF
2004-09-28 ABN Abandonment 2 View
2004-09-10 XT/ Extension of Time 1 View
2004-03-10 CTNF Non-Final Rejection 13 View
2004-03-10 892 List of references cited by examiner 1 View
2004-03-10 FOR Foreign Reference 53 View
2004-03-10 FWCLM Index of Claims 1 View
2004-03-10 SRFW Search information including classification, databases and other search related notes 1 View
2004-03-01 SRNT Examiner's search strategy and results 1 View
2004-02-27 SRNT Examiner's search strategy and results 4 View
2002-11-12 TRNA Transmittal of New Application 3 View
2002-11-12 DRW Drawings-only black and white line drawings 29 View
2002-11-12 LET. Miscellaneous Incoming Letter 1 View
2002-08-06 WFEE Fee Worksheet (SB06) 1 View
2002-08-06 WFEE Fee Worksheet (SB06) 1 View
2002-08-06 WCLM Claims Worksheet (PTO-2022) 2 View
2002-08-06 TRNA Transmittal of New Application 2 View
2002-08-06 ADS Application Data Sheet 3 View
2002-08-06 A.PE Preliminary Amendment 8 View
2002-08-06 SPEC Specification 87 View
2002-08-06 CLM Claims 15 View
2002-08-06 ABST Abstract 1 View
2002-08-06 DRW Drawings-only black and white line drawings 29 View
2002-08-06 OATH Oath or Declaration filed 6 View
2002-08-06 LET. Miscellaneous Incoming Letter 1 View
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Quick Facts
App. No.
10/212,217
Filed
2002-08-06
Pub. No.
US20030049381A1
Art Unit
1762