IP Library Granted Patent US 6,841,886
Granted Patent B2
US 6,841,886 · App. 10/219,194 · Granted Jan 11, 2005

Layout structure for a flip chip semiconductor integrated circuit

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Quick Facts
Patent No.
US 6,841,886
App. No.
10/219,194
Granted
Jan 11, 2005
Kind
B2
Abstract

There is disclosed a flip chip semiconductor integrated circuit, which comprises an internal cell, an I/O buffer as an interface between the internal cell and an external unit, a solder ball, a GND or power supply wire, and an I/O buffer unit arranged on a chip. In this case, the components except the I/O buffer unit are formed in a unit and arranged on the chip, and the I/O buffer unit includes a signal solder ball for transferring signals with the external unit, an I/O buffer having a signal terminal connected to the signal solder ball, a first I/O buffer GND wire connected to a GND terminal of the I/O buffer, and a first I/O buffer power supply wire connected to a power supply terminal of the I/O buffer.

Claims (32)

1. A flip chip semiconductor integrated circuit comprising:

an internal cell;

a solder ball;

a GND or power supply wire; and

an I/O buffer unit arranged on a chip, the I/O buffer unit including an I/O buffer as an interface between the internal cell and an external unit;

wherein the internal cell, solder ball and ground or power supply wire are arranged in a unit, and

the I/O buffer unit includes; a signal solder ball formed on the I/O buffer unit for transferring signals with the external unit; an I/O buffer having a signal terminal connected to the signal solder ball; a first I/O buffer GND wire connected to a GND terminal of the I/O buffer; and a first I/O buffer power supply wire connected to a power supply terminal of the I/O buffer.

2. The flip chip semiconductor integrated circuit according to claim 1 , further comprising an I/O buffer GND unit arranged on the chip, which includes an I/O buffer GND solder ball for supplying a GND potential from the external unit to the I/O buffer, and a second I/O buffer GND wire connected to the I/O buffer GND solder ball, and to the first I/O buffer GND wire of the adjacently arranged I/O buffer unit.

3. The flip chip semiconductor integrated circuit according to claim 1 , further comprising an I/O buffer power supply unit arranged on the chip, which includes an I/O buffer power supply solder ball for supplying a power supply potential from the external unit to the I/O buffer, and a second I/O buffer power supply wire connected to the I/O buffer power supply solder ball, and to the first I/O buffer power supply wire of the adjacently arranged I/O buffer unit.

4. The flip chip semiconductor integrated circuit according to claim 1 , further comprising an internal cell GND unit arranged on the chip, which includes an internal cell GND solder ball for supplying a GND potential from the external unit to the internal cell, and a second internal cell GND wire connected to the internal cell GND solder ball, and to a first internal cell GND wire of another adjacently arranged unit.

5. The flip chip semiconductor integrated circuit according to claim 1 , further comprising an internal cell power supply unit arranged on the chip, which includes an internal cell power supply solder ball for supplying a power supply potential from the external unit to the internal cell, and a second internal cell power supply wire connected to the internal cell power supply solder ball, and to a first internal cell power supply wire of another adjacently arranged unit.

6. The flip chip semiconductor integrated circuit according to claim 1 , further comprising a GND unit having no solder balls arranged on the chip, which includes a third internal cell GND wire connected to a first internal cell GND wire of another adjacently arranged unit.

7. The flip chip semiconductor integrated circuit according to claim 1 , further comprising a power supply unit having no solder balls arranged on the chip, which includes a third internal cell power supply wire connected to a first internal cell power supply wire of another adjacently arranged unit.

8. The flip chip semiconductor integrated circuit according to claim 1 , wherein each unit has a size equal to/smaller than a solder ball pitch.

9. A flip chip semiconductor integrated circuit comprising:

an internal cell;

an I/O buffer as an interface between the internal cell and an external unit;

a solder ball;

a GND or power supply wire; and

an I/O buffer unit arranged on a chip,

wherein the I/O buffer unit includes: a signal solder ball for transferring signals with the external unit; an I/O buffer having a signal terminal connected to the signal solder ball; a first I/O buffer GND wire connected to a GND terminal of the I/O butter and a first I/O buffer power supply wire connected to a power supply terminal of the I/O buffer, and

wherein die I/O buffer is arranged directly below the signal solder ball, and the signal terminal of the I/O buffer is connected through a through-hole to the signal solder ball.

10. The flip chip semiconductor integrated circuit according to claim 9 , wherein the I/O buffer unit includes a shield wire arranged around to the through-hole, and connected to the first I/O buffer GND wire or the first I/O buffer power supply wire.

11. The flip chip semiconductor integrated circuit according to claim 1 , further comprising a unit arranged on the chip, which has a size larger by an integral multiple than a solder ball pitch, and include, a cell larger in size than the solder ball pitch.

12. The flip chip semiconductor integrated circuit according to claim 1 , wherein the internal cell GND and power supply wires of each unit are arranged at a pitch equal to 1/integer of a solder ball pitch.

13. The flip chip semiconductor integrated circuit according to claim 9 , further comprising an I/O buffer GND unit arranged on the chip, which includes an I/O buffer GND solder ball for supplying a GND potential from the external unit to the I/O buffer, and a second I/O buffer GND wire connected to the I/O buffer GND solder ball, and to the first I/O buffer GND wire of the adjacently arranged I/O buffer unit.

14. The flip chip semiconductor integrated circuit according to 9 , further comprising an I/O buffer power supply unit arranged on the chip, which includes an I/O buffer power supply solder ball for supplying a power supply potential from the external unit to the I/O buffer, and a second I/O buffer power supply wire connected to the I/O buffer power supply solder ball, and to the first I/O buffer power supply wire of the adjacently arranged I/O buffer unit.

15. The flip chip semiconductor integrated circuit according to claim 9 , further comprising an internal cell GND unit arranged on the chip, which includes an internal cell GND solder ball for supplying a GND potential from the external unit to the internal cell, and a second internal cell GND wire connected to the internal cell GND solder ball, and to a first internal cell GND wire of another adjacently arranged unit.

16. The flip chip semiconductor integrated circuit according to claim 9 , further comprising an internal cell power supply unit arranged on the chip, which includes an internal cell power supply solder ball for supplying a power supply potential from the external unit to the internal cell, and a second internal cell power supply wire connected to the internal cell power supply solder ball, and to a first internal cell power supply wire of another adjacently arranged unit.

17. The flip chip semiconductor integrated circuit according to claim 9 , further comprising a GND unit having no solder bells arranged on the chip, which includes a third internal cell GND wire connected to a first internal cell GND wire of another adjacently arranged unit.

18. The flip chip semiconductor integrated circuit according to claim 9 , further comprising a power supply unit having no solder balls arranged on the chip, which includes a third internal cell power supply wire connected to a first internal cell power supply wire of another adjacently arranged unit.

19. The flip chip semiconductor integrated circuit according to claim 9 , wherein each unit has a size equal to/smaller than a solder bell pitch.

Assignments (4)
CHANGE OF ADDRESS Recorded Nov 29, 2017
From: RENESAS ELECTRONICS CORPORATION
To: RENESAS ELECTRONICS CORPORATION
Reel/Frame 044928/0001 →
CHANGE OF NAME Recorded Dec 13, 2010
From: NEC ELECTRONICS CORPORATION
To: RENESAS ELECTRONICS CORPORATION
Reel/Frame 025486/0561 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Feb 24, 2003
From: NEC CORPORATION
To: NEC ELECTRONICS CORPORATION
Reel/Frame 013777/0594 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Aug 15, 2002
From: NAKATA, TSUYOSHI; OOTAKE, TOSHIKAZU
To: NEC CORPORATION
Reel/Frame 013199/0362 →