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App. No. 10/234,256 · Confirmation No. 8326

SEMICONDUCTOR MEMORY DEVICE WITH ENHANCED RELIABILITY

Patent Expired Due to NonPayment of Maintenance Fees Under 37 CFR 1.362 View Patent ↗ View Publication ↗
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 Code Description Pages PDF
2004-02-17 IFEE Issue Fee Payment (PTO-85B) 1 View
2004-02-12 CTMS Miscellaneous Action with shortened statutory period (SSP) 2 View
2004-02-12 IDS Information Disclosure Statement (IDS) Form (SB08) 1 View
2004-01-29 RUSH Printer Query form, used by the publications branch 2 View
2004-01-23 XRUSH Internal Response to Printer Query from Technology Center(TC) 2 View
2003-12-18 LET. Miscellaneous Incoming Letter 5 View
2003-11-17 NOA Notice of Allowance and Fees Due (PTOL-85) 4 View
2003-11-17 NOA Notice of Allowance and Fees Due (PTOL-85) 3 View
2003-11-17 892 List of references cited by examiner 1 View
2003-11-17 IIFW Issue Information including classification, examiner, name, claim, renumbering, etc. 1 View
2003-11-17 FWCLM Index of Claims 1 View
2003-11-17 SRFW Search information including classification, databases and other search related notes 1 View
2002-09-05 TRNA Transmittal of New Application 2 View
2002-09-05 SPEC Specification 19 View
2002-09-05 CLM Claims 4 View
2002-09-05 ABST Abstract 1 View
2002-09-05 DRW Drawings-only black and white line drawings 15 View
2002-09-05 OATH Oath or Declaration filed 4 View
2002-09-05 TRNA Transmittal of New Application 2 View
2002-09-05 SPEC Specification 19 View
2002-09-05 CLM Claims 4 View
2002-09-05 ABST Abstract 1 View
2002-09-05 DRW Drawings-only black and white line drawings 15 View
2002-09-05 OATH Oath or Declaration filed 4 View
2002-09-05 FRPR Certified Copy of Foreign Priority Application 49 View
2002-09-05 IDS Information Disclosure Statement (IDS) Form (SB08) 3 View
2002-09-05 WFEE Fee Worksheet (SB06) 1 View
2002-09-05 WFEE Fee Worksheet (SB06) 1 View
2002-09-05 FOR Foreign Reference 10 View
2002-09-05 FOR Foreign Reference 10 View
2002-09-05 FOR Foreign Reference 12 View
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Quick Facts
App. No.
10/234,256
Filed
2002-09-05
Granted
2004-08-24
Pub. No.
US20030174566A1
Examiner
NGUYEN, TAN
Art Unit
2818
PTA
-120 days