Granted Patent
Utility
US 6,815,726
· Confirmation No. 8051
SEMICONDUCTOR DEVICE AND SEMICONDUCTOR SUBSTRATE, AND METHOD OF FABRICATING THE SAME
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Code | Description | Pages | ||
|---|---|---|---|---|---|
| 2004-09-30 | IFEE |
Issue Fee Payment (PTO-85B) | 1 | View | |
| 2004-07-01 | NOA |
Notice of Allowance and Fees Due (PTOL-85) | 3 | View | |
| 2004-07-01 | NOA |
Notice of Allowance and Fees Due (PTOL-85) | 1 | View | |
| 2004-07-01 | IIFW |
Issue Information including classification, examiner, name, claim, renumbering, etc. | 1 | View | |
| 2004-07-01 | FWCLM |
Index of Claims | 1 | View | |
| 2004-07-01 | SRFW |
Search information including classification, databases and other search related notes | 1 | View | |
| 2004-05-03 | WFEE |
Fee Worksheet (SB06) | 1 | View | |
| 2004-05-03 | LET. |
Miscellaneous Incoming Letter | 2 | View | |
| 2004-04-30 | A... |
Amendment/Request for Reconsideration-After Non-Final Rejection | 5 | View | |
| 2004-04-30 | CLM |
Claims | 4 | View | |
| 2004-04-30 | REM |
Applicant Arguments/Remarks Made in an Amendment | 3 | View | |
| 2004-01-02 | CTNF |
Non-Final Rejection | 4 | View | |
| 2004-01-02 | 1449 |
List of References cited by applicant and considered by examiner | 4 | View | |
| 2004-01-02 | 892 |
List of references cited by examiner | 1 | View | |
| 2004-01-02 | SRFW |
Search information including classification, databases and other search related notes | 1 | View | |
| 2004-01-02 | FWCLM |
Index of Claims | 1 | View | |
| 2003-05-16 | OATH |
Oath or Declaration filed | 4 | View | |
| 2003-05-16 | IDS |
Information Disclosure Statement (IDS) Form (SB08) | 6 | View | |
| 2003-04-11 | PEFN |
Pre-Exam Formalities Notice | 1 | View | |
| 2003-03-17 | TRNA |
Transmittal of New Application | 6 | View | |
| 2003-03-17 | ADS |
Application Data Sheet | 2 | View | |
| 2003-03-17 | SPEC |
Specification | 34 | View | |
| 2003-03-17 | CLM |
Claims | 3 | View | |
| 2003-03-17 | ABST |
Abstract | 2 | View | |
| 2003-03-17 | DRW |
Drawings-only black and white line drawings | 15 | View | |
| 2003-03-17 | WFEE |
Fee Worksheet (SB06) | 1 | View | |
| 2003-03-17 | WFEE |
Fee Worksheet (SB06) | 1 | View | |
| 2003-03-17 | WCLM |
Claims Worksheet (PTO-2022) | 1 | View |
Inventors
Masahiro Ishida
Osaka, JAPAN
Shinji Nakamura
Osaka, JAPAN
Kenji Orita
Osaka, JAPAN
Osamu Imafuji
Osaka, JAPAN
Masaaki Yuri
Osaka, JAPAN
Attorneys & Agents of Record
Classification
USPC
257/94
H10H20/0137
H10D62/405
H10D62/8503
H10H20/01335
H10H20/018
H10P14/36
H10P14/2925
H10P14/2921
H10P14/2901
H10P14/2926
H10P14/2908
H10P14/3248
H10P14/24
H10P14/3216
H10P14/3242
H10P14/3416
Prosecution
- Examiner
- CRANE, SARA W
- Art Unit
- 2811
- Customer No.
- 20322
- Docket No.
- 28569.4117
- Confirmation No.
- 8051
Foreign Priority
10-259907
·
1998-09-14
·
JAPAN
11-133844
·
1999-05-14
·
JAPAN
Publication
- Pub. No.
- US20030197166A1
- Pub. Date
- 2003-10-23
Patent Term Adjustment
-28days
ASSIGNMENT OF ASSIGNOR'S INTEREST
Recorded 2019-03-13
CHANGE OF NAME
Recorded 2018-09-13
MERGER
Recorded 2003-05-16
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Quick Facts
- Patent No.
- US 6,815,726
- App. No.
- 10/249,116
- Filed
- 2003-03-17
- Granted
- 2004-11-09
- Pub. No.
- US20030197166A1
- Examiner
- CRANE, SARA W
- Art Unit
- 2811
- PTA
- -28 days
External Links