Defect tracking by utilizing real-time counters in network computing environments
View Patent ↗Disclosed are novel methods and apparatus for manipulating and generating a real-time counter in network computing environments. In an embodiment, a method of tracking a defect is disclosed. The method includes providing a defect abstract, the defect abstract including information to identify the defect; identifying a component having the defect; assigning a user to resolve the defect; and assigning a defect number to identify the defect, the defect number obtained by incrementing a counter value stored in a file, the file being accessible by a single user at a time.
1. A method of tracking a defect, the method comprising:
providing a defect abstract including information to identify the defect;
identifying a component having the defect;
assigning a user to resolve the defect; and
assigning a unique defect number to identify the defect by associating a counter value with the defect.
2. The method of claim 1 wherein the counter value is stored in a file replicated on a different computer system.
3. The method of claim 1 further including providing a status of the defect selected from a group comprising open, closed, working, and investigate.
4. The method of claim 1 further including providing a priority for the defect to prioritize a resolution of the defect compared with a plurality of other defects.
5. The method of claim 1 further including providing a project name corresponding to a component having the defect.
6. The method of claim 1 wherein the counter value increments by one after the unique defect number is assigned to the defect.
7. The method of claim 1 wherein the component is selected from a group comprising Synthesis, Layout, Schematic, PR, PDV, Timing, Noise, Simulation, Extraction, Verification, Environment, DReAM, Network, CDMS, Library, License, CAD, and CRM.
8. The method of claim 1 wherein the component with the defect is an IC component.
9. A system for tracking a defect, the system comprising:
a defect abstractor to provide information to identify the defect;
an identifier to identify a component having the defect;
a resolution assigner to assign a user to resolve the defect; and
a defect number assigner to assign a unique defect number to identify the defect by associating a counter value with the defect.
10. The system of claim 9 wherein the counter value is stored in a file replicated on a different computer system.
11. The system of claim 9 further including a status facility to provide a status of the defect selected from a group comprising open, closed, working, and investigate.
12. The system of claim 9 further including a prioritizing facility to provide a priority for the defect to prioritize a resolution of the defect compared with a plurality of other defects.
13. The system of claim 9 further including a naming facility to provide a project name corresponding to a component having the defect.
14. The system of claim 9 wherein the counter value increments by one after the unique defect number is assigned to the defect.
15. The system of claim 9 wherein the component is selected from a group comprising Synthesis, Layout, Schematic, PR, PDV, Timing, Noise, Simulation, Extraction, Verification, Environment, DReAM, Network, CDMS, Library, License, CAD, and CRM.
16. The system of claim 9 wherein the component with the defect is an IC component.
17. An article of manufacture for tracking a defect, the article comprising:
a machine readable medium that provides instructions that, if executed by a machine, will cause the machine to perform operations including:
providing a defect abstract including information to identify the defect;
identifying a component having the defect;
assigning a user to resolve the defect; and
assigning a unique defect number to identify the defect by associating a counter value with the defect.
18. The article of claim 17 wherein the counter value is stored in a file replicated on a different computer system.
19. The article of claim 17 wherein the component is selected from a group comprising Synthesis, Layout, Schematic, PR, PDV, Timing, Noise, Simulation, Extraction, Verification, Environment, DReAM, Network, CDMS, Library, License, CAD, and CRM.
20. The article of claim 17 wherein the component with the defect is an IC component.