Negative ion atmospheric pressure ionization and selected ion mass spectrometry using a 63NI electron source
View Patent ↗Negative ion atmospheric pressure ionization mass spectrometers and selected ion mass spectrometers with a 63 Ni ion source and a drift tube for reaction of a sample with electrons from the 63 Ni ion source prior to analysis of a sample by mass spectrometry are provided. Also provided are methods for chemically analyzing a sample by negative ion atmospheric pressure ionization mass spectrometry by exposing the sample to electrons from a 63 Ni ion source in a drift tube and allowing the sample and electrons to react in the drift tube prior to analysis via mass spectrometry.
1. A negative ion atmospheric pressure ionization mass spectrometer or a selected ion mass spectrometer comprising:
(a) a nickel-63 ion source;
(b) a drift tube 5 to 15 mm in diameter and 25 to 100 mm in length having a first end and a second end, said drift tube being connected to the nickel-63 ion source at said first end; and
(c) a mass spectrometer connected to said second end of said drift tube.
2. A method for chemically analyzing a sample by negative ion atmospheric pressure ionization mass spectrometry comprising:
(a) exposing a sample to electrons from a nickel-63 ion source at a first end of a drift tube 5 to 15 mm in diameter and 25 to 100 m in length;
(b) allowing the sample and electrons to react as the sample and electrons drift to the second end of the drift tube; and
(c) analyzing the reacted sample and electrons via a mass spectrometer connected to the second end of the drift tube.
3. The method of claim 2 wherein the sample is chemically analyzed for water content.
4. The method of claim 2 wherein the sample comprises an analyte having an isotopomer and wherein the isotopomer is added as an internal standard to the sample prior to step (a) so that a ratio of intensities of the analyte and isotopomer can be measured and analyte concentration in the sample quantified from the ratio.