IP Library › Granted Patent US 6,781,205
Granted Patent Utility
US 6,781,205 · Confirmation No. 6012

ELECTROSTATIC CHARGE MEASUREMENT ON SEMICONDUCTOR WAFERS

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2010-06-21 PET.POA.WDRW Request for withdrawal as attorney or agent 3 View
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2004-05-17 1449 List of References cited by applicant and considered by examiner 1 View
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2004-05-17 FWCLM Index of Claims 1 View
2004-05-17 SRFW Search information including classification, databases and other search related notes 1 View
2004-05-07 SRNT Examiner's search strategy and results 1 View
2004-04-16 ELC. Response to Election / Restriction Filed 2 View
2004-04-16 REM Applicant Arguments/Remarks Made in an Amendment 2 View
2004-03-18 CTRS Requirement for Restriction/Election 5 View
2003-09-11 LET. Miscellaneous Incoming Letter 2 View
2003-02-10 LET. Miscellaneous Incoming Letter 1 View
2003-02-10 TRNA Transmittal of New Application 5 View
2003-02-10 A.PE Preliminary Amendment 1 View
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2002-12-17 LET. Miscellaneous Incoming Letter 1 View
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2002-10-11 TRNA Transmittal of New Application 3 View
2002-10-11 SPEC Specification 10 View
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2002-10-11 ABST Abstract 1 View
2002-10-11 DRW Drawings-only black and white line drawings 5 View
2002-10-11 OATH Oath or Declaration filed 3 View
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Quick Facts
Patent No.
US 6,781,205
App. No.
10/269,426
Filed
2002-10-11
Granted
2004-08-24
Examiner
NADAV, ORI
Art Unit
2811
PTA
-25 days