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App. No. 10/287,023 · Confirmation No. 5083

SEMICONDUCTOR INTEGRATED CIRCUIT DEVICE AND CHARACTERISTIC MEASUREMENT METHOD THEREOF

Inventor: Hirokazu Miyazaki
Patent Expired Due to NonPayment of Maintenance Fees Under 37 CFR 1.362 View Patent ↗ View Publication ↗
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Quick Facts
App. No.
10/287,023
Filed
2002-11-04
Granted
2004-06-15
Pub. No.
US20030168681A1
Art Unit
2826
PTA
0 days