IP Library Granted Patent US 7,065,724
Granted Patent B2
US 7,065,724 · App. 10/349,570 · Granted Jun 20, 2006

Method and apparatus for generating and verifying libraries for ATPG tool

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Quick Facts
Patent No.
US 7,065,724
App. No.
10/349,570
Granted
Jun 20, 2006
Kind
B2
Abstract

A method generates and verifies a design-for-test (DFT) library for an automatic test pattern generator (ATPG) tool. The method includes (a) creating a synthesis library including primitives to be used to create the modules, the primitives being the same as primitives used by the ATPG tool, (b) creating a register transfer level (RTL) description for each module, (c) performing synthesis using the synthesis library and the RTL description to create a gate level description for each module, and (d) generating the DFT library by converting a hardware description language (HDL) of the gate level description into a script language for the ATPG tool to create a DFT file for each module. The method may further include (e) converting the DFT files into a RTL description to create a pseudo-RTL description for each module, and (f) comparing the RTL description and the pseudo-RTL description for verification of the DFT library.

Claims (76)

1. A method for generating a design-for-test (DFT) library for an automatic test pattern generator (ATPG) tool, the ATPG tool generating test vectors for an integrated circuit (IC) design including cells, and a source design library of the IC design including modules corresponding to the cells, said method comprising:

creating a synthesis library including primitives to be used to create the modules, the primitives being the same as primitives used by the ATPG tool;

creating a register transfer level (RTL) description for each module;

performing synthesis using the synthesis library and the RTL description of each module, so as to create a gate level description for each module;

generating the DFT library by converting a hardware description language (HDL) of the gate level description into a script language for the ATPG tool so as to create a DFT file for each module; and

verifying the DFT library, said verifying comprising:

converting the DFT files into a RTL description so as to create a pseudo-RTL description for each module; and

comparing the RTL description and the pseudo-RTL description.

2. A method in accordance with claim 1 , wherein the synthesis library includes all primitives used by the ATPG tool.

3. A method in accordance with claim 2 , wherein the synthesis library includes all and only primitives used by the ATPG tool.

4. A method in accordance with claim 1 , wherein the synthesis library further includes module identifications used by the ATPG tool.

5. A method in accordance with claim 4 , wherein the module identifications are the corresponding cell names used in the DFT library.

6. A method in accordance with claim 1 , wherein said creating a register transfer level (RTL) description includes:

creating a first file for each module, the first file including the RTL description of the module.

7. A method in accordance with claim 6 , further comprising:

creating an association between cell names and the first files; and

creating a synthesis script for a synthesis tool.

8. A method in accordance with claim 7 , wherein the association is in a form of a list of RTL modules.

9. A method in accordance with claim 1 , wherein said performing synthesis includes:

creating a second file for each module, the second file including the gate level net list of the module.

10. A method in accordance with claim 1 wherein said converting includes:

creating a third file for each module, the third file including the pseudo-RTL description of the module.

11. A method in accordance with claim 1 , further comprising:

creating an association between cell names and the DFT files.

12. A method in accordance with claim 11 wherein the association is in a form of a list of DFT modules.

13. A method in accordance with claim 1 , further comprising:

creating a set of program instructions for the ATPG tool and a test design file using a list of cells;

generating test patterns with the ATPG tool using the DFT library and the test design file; and

simulating the IC design with the test patterns using the test design file and the source design file so as to verify the DFT library.

14. A method in accordance with claim 13 , wherein the design file includes inputs and outputs of the IC design and inter-cell connectivity.

15. An apparatus for generating a design-for-test (DFT) library for automatic test pattern generation (ATPG), the ATPG generating test vectors for an integrated circuit (IC) design including cells, a source design library of the IC design including modules corresponding to the cells, said apparatus comprising:

means for creating a synthesis library including primitives to be used to create the modules, the primitives being the same as primitives used by the ATPG tool;

means for creating a register transfer level (RTL) description for each module;

means for performing synthesis using the synthesis library and the RTL description of each module, so as to create a gate level description for each module;

means for generating the DFT library, said means for generating the DFT library including means for converting a hardware description language (HDL) of the gate level description into a script language for the ATPG tool so as to create a DFT file for each module; and

means for verifying the DFT library, said means for verifying comprising:

means for converting the DFT files into a RTL description so as to create a pseudo-RTL description for each module; and

means for comparing the RTL description and the pseudo-RTL description.

16. An apparatus in accordance with claim 15 , wherein the synthesis library includes all primitives used by the ATPG tool.

17. An apparatus in accordance with claim 16 , wherein the synthesis library includes all and only primitives used by the ATPG tool.

18. An apparatus in accordance with claim 15 , wherein the synthesis library further includes module identifications used by the ATPG tool.

19. An apparatus in accordance with claim 18 , wherein the module identifications are the corresponding cell names used in the DFT library.

20. An apparatus in accordance with claim 15 , wherein said means for creating a RTL description includes:

means for creating a first file for each module, the first file including the RTL description of the module.

21. An apparatus in accordance with claim 20 , further comprising:

means for creating an association between cell names and the first files; and

means for creating a synthesis script for a synthesis tool.

22. An apparatus in accordance with claim 21 , wherein the association is in a form of a list of RTL modules.

23. An apparatus in accordance with claim 15 , wherein said means for performing synthesis includes:

means for creating a second file for each module, the second file including the gate level net list of the module.

24. An apparatus in accordance with claim 15 wherein said means for converting includes:

means for creating a third file for each module, the third file including the pseudo-RTL description of the module.

25. An apparatus in accordance with claim 15 , further comprising:

means for creating an association between cell names and the DFT files.

26. An apparatus in accordance with claim 25 , wherein the association is in a form of a list of DFT modules.

27. An apparatus in accordance with claim 15 , further comprising:

means for creating a set of program instructions for the ATPG tool and a test design file using a list of cells;

means for generating test patterns with the ATPG tool using the DFT library and the test design file; and

means for simulating the IC design with the test patterns using the test design file and the source design file so as to verify the DFT library.

28. An apparatus in accordance with claim 27 , wherein the design file includes inputs and outputs of the IC design and inter-cell connectivity.

29. A program storage device readable by a machine, tangibly embodying a program of instructions executable by the machine to perform a method for generating a design-for-test (DFT) library for an automatic test pattern generator (ATPG) tool, the ATPG tool generating test vectors for an integrated circuit (IC) design including cells, and a source design library of the IC design including modules corresponding to the cells, said method comprising:

creating a synthesis library including primitives to be used to create the modules, the primitives being the same as primitives used by the ATPG tool;

creating a register transfer level (RTL) description for each module;

performing synthesis using the synthesis library and the RTL description of each module, so as to create a gate level description for each module;

generating the DFT library by converting a hardware description language (HDL) of the gate level description into a script language for the ATPG tool so as to create a DFT file for each module; and

verifying the DFT library, said verifying comprising:

converting the DFT files into a RTL description so as to create a pseudo-RTL description for each module; and

comparing the RTL description and the pseudo-RTL description.

30. A programmable storage device in accordance with claim 29 , wherein the synthesis library includes all primitives used by the ATPG tool.

31. A programmable storage device in accordance with claim 30 , wherein the synthesis library includes all and only primitives used by the ATPG tool.

32. A programmable storage device in accordance with claim 29 , wherein the synthesis library further includes module identifications used by the ATPG tool.

33. A programmable storage device in accordance with claim 32 , wherein the modules in the synthesis library have same names as corresponding cell names in the DFT library.

34. A programmable storage device in accordance with claim 29 wherein said method further includes:

creating a set of program instructions for the ATPG tool and a test design file using a list of cells;

generating test patterns with the ATPG tool using the DFT library and the test design file; and

simulating the IC design with the test patterns using the test design file and the source design file so as to verify the DFT library.

Assignments (3)
MERGER AND CHANGE OF NAME Recorded Dec 16, 2015
From: ORACLE USA, INC.; SUN MICROSYSTEMS, INC.; ORACLE AMERICA, INC.
To: ORACLE AMERICA, INC.
Reel/Frame 037302/0633 →
MERGER AND CHANGE OF NAME Recorded Dec 14, 2015
From: ORACLE USA, INC.; SUN MICROSYSTEMS, INC.; ORACLE AMERICA, INC.
To: ORACLE AMERICA, INC.
Reel/Frame 037280/0232 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jan 22, 2003
From: CATY, OLIVIER; BAYRAKTAROGLU, ISMET; MAJUMDAR, AMITAVA
To: SUN MICROSYSTEMS, INC.
Reel/Frame 013695/0008 →