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App. No. 10/373,498 · Confirmation No. 7607

METHODS OF STORING A TEMPERATURE IN AN INTEGRATED CIRCUIT, METHOD OF MODIFYING OPERATION OF DYNAMIC RANDOM ACCESS MEMORY IN RESPONSE TO TEMPERATURE, PROGRAMMABLE TEMPERATURE SENSING CIRCUIT AND MEMORY INTEGRATED CIRCUIT

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2004-01-02 DIST Terminal Disclaimer Filed 2 View
2004-01-02 LET. Miscellaneous Incoming Letter 2 View
2003-10-01 CTNF Non-Final Rejection 5 View
2003-10-01 892 List of references cited by examiner 1 View
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2003-04-03 LET. Miscellaneous Incoming Letter 2 View
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2003-04-03 CLM Claims 15 View
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2003-02-24 SPEC Specification 27 View
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2003-02-24 FWCLM Index of Claims 1 View
2003-02-24 TRNA Transmittal of New Application 2 View
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2003-02-24 SPEC Specification 27 View
2003-02-24 CLM Claims 8 View
2003-02-24 ABST Abstract 1 View
2003-02-24 OATH Oath or Declaration filed 6 View
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Quick Facts
App. No.
10/373,498
Filed
2003-02-24
Granted
2004-08-17
Pub. No.
US20030174559A1
Examiner
MAI, SON LUU
Art Unit
2818
PTA
-1 days