IP Library Granted Patent US 7,146,543
Granted Patent B2
US 7,146,543 · App. 10/384,742 · Granted Dec 5, 2006

Semiconductor device mounting chip having tracing function

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Quick Facts
Patent No.
US 7,146,543
App. No.
10/384,742
Granted
Dec 5, 2006
Kind
B2
Abstract

A trace chip monitors a signal between a target logic chip having a data processing circuit mounted thereon and a memory chip having a memory storing data to be used by the target logic chip mounted therein, and traces an operation of the target logic chip. As the trace chip is implemented by a chip separate from the target logic chip and a memory chip, a debugging circuit need not be added to mass-produced articles when the trace chip is not mounted to the mass-produced articles. Thus, manufacturing cost of the articles can be reduced.

Claims (61)

1. A semiconductor device comprising:

a first chip as an object of tracing and having a data processing circuit mounted thereon;

a second chip having a storage circuit storing data used by said first chip mounted thereon; and

a third chip monitoring a signal between said first chip and said second chip and tracing an operation of said first chip, formed by a chip separate from said first and second chips,

wherein said third chip includes

a sample pad inserted between a wiring between said first and second chips,

a trace circuit monitoring a signal flowing through the sample pad and controlling tracing of said first chip,

a first storage circuit successively storing the signal flowing through the sample pad as trace information, and

an external input/output port externally outputting the trace information stored in said first storage circuit and externally receiving data as an input for setting of said trace circuit,

wherein said trace circuit includes

a trace point register storing a memory address to be monitored,

a comparing circuit comparing an address flowing through said sample pad with the memory address stored in said trace point register, and

a control circuit controlling progress of tracing based on a result of comparison by said comparing circuit.

2. A semiconductor device comprising:

a first chip as an object of tracing and having a data processing circuit mounted thereon;

a second chip having a storage circuit storing data used by said first chip mounted thereon; and

a third chip monitoring a signal between said first chip and said second chip and tracing an operation of said first chip, formed by a chip separate from said first and second chips,

wherein said third chip includes

a sample pad inserted between a wiring between said first and second chips,

a trace circuit monitoring a signal flowing through the sample pad and controlling tracing of said first chip,

a first storage circuit successively storing the signal flowing through the sample pad as trace information, and

an external input/output port externally outputting the trace information stored in said first storage circuit and externally receiving data as an input for setting of said trace circuit,

wherein said trace circuit includes

a second storage circuit storing a program for controlling tracing, and

a microcontroller controlling tracing by monitoring the signal flowing through said sample pad, in accordance with the program stored in said second storage circuit.

3. A semiconductor device comprising:

a first chip as an object of tracing and having a data processing circuit mounted thereon;

a second chip having a storage circuit storing data used by said first chip mounted thereon; and

a third chip monitoring a signal between said first chip and said second chip and tracing an operation of said first chip, formed by a chip separate from said first and second chips,

wherein said third chip includes

a sample pad inserted between a wiring between said first and second chips,

a trace circuit monitoring a signal flowing through the sample pad and controlling tracing of said first chip,

a first storage circuit successively storing the signal flowing through the sample pad as trace information, and

an external input/output port externally outputting the trace information stored in said first storage circuit and externally receiving data as an input for selling of said trace circuit,

wherein said trace circuit includes a reconfigurable device having a circuitry reconfigurable by external information, for controlling tracing by monitoring the signal flowing through said sample pad.

4. A semiconductor device comprising:

a first chip as an object of tracing and having a data processing circuit mounted thereon;

a second chip having a storage circuit storing data used by said first chip mounted thereon; and

a third chip monitoring a signal between said first chip and said second chip and tracing an operation of said first chip, formed by a chip separate from said first and second chips,

wherein said third chip includes

a sample pad inserted between a wiring between said first and second chips,

a trace circuit monitoring a signal flowing through the sample pad and controlling tracing of said first chip,

a first storage circuit successively storing the signal flowing through the sample pad as trace information, and

an external input/output port externally outputting the trace information stored in said first storage circuit and externally receiving data as an input for setting of said trace circuit,

wherein said sample pad includes

a first pad connected to said first chip by a wire,

a second pad connected to said second chip by a wire, and

a driver connected between said first and second pads.

5. A semiconductor device comprising:

a first chip as an object of tracing and having a data processing circuit mounted thereon;

a second chip having a storage circuit storing data used by said first chip mounted thereon; and

a third chip monitoring a signal between said first chip and said second chip and tracing an operation of said first chip, formed by a chip separate from said first and second chips,

wherein said third chip includes

a sample pad inserted between a wiring between said first and second chips,

a trace circuit monitoring a signal flowing through the sample pad and controlling tracing of said first chip,

a first storage circuit successively storing the signal flowing through the sample pad as trace information, and

an external input/output port externally outputting the trace information stored in said first storage circuit and externally receiving data as an input for setting of said trace circuit,

wherein said sample pad includes

a first pad connected to said first chip by a wire,

a second pad connected to said second chip by a wire, and

a terminating resistance connected to a line between said first and second pads.

Assignments (5)
CHANGE OF NAME Recorded Sep 15, 2010
From: NEC ELECTRONICS CORPORATION
To: RENESAS ELECTRONICS CORPORATION
Reel/Frame 024990/0059 →
MERGER Recorded Sep 15, 2010
From: RENESAS TECHNOLOGY CORP.
To: NEC ELECTRONICS CORPORATION
Reel/Frame 024990/0098 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Apr 7, 2004
From: MITSUBISHI DENKI KABUSHIKI KAISHA
To: RENESAS TECHNOLOGY CORP.
Reel/Frame 015185/0122 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Sep 10, 2003
From: MITSUBISHI DENKI KABUSHIKI KAISHA
To: RENESAS TECHNOLOGY CORP.
Reel/Frame 014502/0289 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Mar 11, 2003
From: HIGASHIDA, MOTOKI; MATSUNAGA, YUSUKE
To: MITSUBISHI DENKI KABUSHIKI KAISHA
Reel/Frame 013866/0368 →