Apertured probes for localized measurements of a material's complex permittivity and fabrication method
A probe for non-destructive determination of complex permittivity of a material and for near field optical microscopy is based on a balanced multi-conductor transmission line structure created on a dielectric substrate member which confines the probing field within a sharply defined sampling volume in the material under study. A method for manufacturing dielectric support member based probes includes anisotropically depositing a 50-100 Å thick underlayer of Cr, Ni, W or Ta onto the dielectric support member, anisotropically depositing conductive material onto the Cr, Ni, W or Ta underlayer, and removing the unwanted conductive material at the sides of the dielectric support member to electrically isolate the created conductive strips.
1. A method for manufacturing dielectric support-based probes having multi-conductor transmission line for complex permittivity measurements, including the steps of:
(a) providing a dielectric support member, said dielectric support member being a fiber optic wire;
(b) removing an outer jacket from said fiber optic wire of predetermined length, thereby exposing a cladding layer surrounding a central optical fiber of said fiber optic wire;
(c) anisotropically depositing onto said dielectric support member at predetermined locations thereof a conductive material extending along the length of said dielectric support member; and
(d) removing said conductive material from said dielectric support member between said predetermined locations thereof, thereby forming a plurality of electrically isolated conductive strips extending around said dielectric support member.
2. The method of claim 1 , further comprising the steps of:
forming a tapered tip portion of said dielectric support member and forming an aperture in said tapered tip portion by removing said conducting material from said tapered tip portion by means of a material removal technique selected from the group consisting of Ion Beam Milling, Focused Ion Beam Milling, and Chemical Etching.
3. The method of claim 2 , further including the steps of:
in said step of Ion Beam Milling of said aperture in said tapered tip portion of said dielectric support member,
positioning said dielectric support member in predetermined mutual disposition with an ion beam, wherein the apex of said tapered tip portion faces said ion beam, and
anisotropically milling said tapered tip portion to create an aperture with a diameter on the order of said apex curvature.
4. The method of claim 1 , further comprising the steps of:
prior to said step (a), anisotropically depositing a 50-100 Å thick underlayer of a material selected from the group of materials, consisting of Cr, Ni, W and Ta directly onto said dielectric support member.
5. The method of claim 4 , wherein said conductive material and said thick underlayer are deposited by a deposition technique selected from a group including: Pulsed Laser Deposition, Evaporation, Dipping, Sputtering, and Electroplating, and a direct write technique employing Lasers and Focused Ion Beams.
6. The method of claim 1 , wherein said conductive material is removed between said predetermined locations by a material removal technique selected from the group consisting of Ion Beam Milling, Focused Ion Beam Milling, and Chemical Etching.
7. The method of claim 1 , wherein said conductive material is removed between said predetermined locations by means of Mask-Less Photo-Lithography, said Mask-Less Photo-Lithography comprising the steps of:
applying a photoresist layer onto a surface of said conductive material,
applying light to said central optical fiber, thus causing anisotropical exposure of said photoresist layer to the light through said conductive material deposited; and,
dipping said fiber wire into an etching solution, thereby allowing etching and removal of said deposited conductive material at locations between said predetermined locations.
8. A method for manufacturing dielectric support-based probes having multi-conductor transmission line for complex permittivity measurements, including the steps of:
(a) anisotropically depositing onto a dielectric support member at predetermined locations thereof a conductive material extending along the length of said dielectric support member;
(b) removing said conductive material from said dielectric support member between said predetermined locations thereof, thereby forming a plurality of electrically isolated conductive strips extending around said dielectric support member; and,
(c) forming a tapered tip portion of said dielectric support member and forming an aperture in said tapered tip portion by removing said conductive material from said tapered tip portion by means of a material removal technique selected from the group consisting of Ion Beam Milling, Focused Ion Beam Milling, and Chemical Etching.
9. The method of claim 8 , further including the steps of:
in said step of Ion Beam Milling of said aperture in said tapered tip portion of said dielectric support member,
positioning said dielectric support member in predetermined mutual disposition with an ion beam, wherein the apex of said tapered tip portion faces said ion beam; and,
anisotropically milling said tapered tip portion to create an aperture with a diameter on the order of said apex curvature.