IP Library Granted Patent US 6,878,981
Granted Patent B2
US 6,878,981 · App. 10/393,958 · Granted Apr 12, 2005

Triple-well charge pump stage with no threshold voltage back-bias effect

Assignee: Tower Semiconductor Ltd.
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Quick Facts
Patent No.
US 6,878,981
App. No.
10/393,958
Granted
Apr 12, 2005
Kind
B2
Abstract

A charge pump stage includes a first n-channel transistor having a source coupled to an input terminal and a drain coupled to an output terminal. A second n-channel transistor has a source coupled to the input terminal, a drain coupled to a gate of the first transistor, and a gate coupled to the output terminal. A third n-channel transistor has a source coupled to the input terminal, a gate coupled to the output terminal, and a drain coupled to a p-well. A fourth n-channel transistor has a source coupled to the output terminal, a gate coupled to the input terminal, and a drain coupled to the p-well. The first, second, third and fourth transistors are fabricated in the p-well, which is surrounded by an n-well. A first capacitor is coupled to the output terminal, and a second capacitor is coupled to the gate of the first transistor.

Claims (49)

1. A charge pump stage comprising:

a first n-channel transistor having a source coupled to an input terminal and a drain coupled to an output terminal;

a second n-channel transistor having a source coupled to the input terminal, a drain coupled to a gate of the first n-channel transistor, and a gate coupled to the output terminal;

a third n-channel transistor having a source coupled to the input terminal, a gate coupled to the output terminal, and a drain coupled to a p-well;

a fourth n-channel transistor having a source coupled to the output terminal, a gate coupled to the input terminal, and a drain coupled to the p-well, wherein the first, second, third and fourth n channel transistors are fabricated in the p-well;

a first capacitor coupled to the output terminal; and

a second capacitor coupled to the gate of the first n-channel transistor.

2. The charge pump stage of claim 1 , further comprising:

a first clock terminal for receiving a first clock signal, wherein the first capacitor is coupled between the output terminal and the first clock terminal; and

a second clock terminal for receiving a second clock signal, wherein the second capacitor is coupled between the gate of the first n-channel transistor and the second clock terminal.

3. The charge pump stage of claim 1 , further comprising:

an n-well surrounding the p-well; and

a p-type region surrounding the n-well.

4. The change pump stage of claim 1 , further comprising:

a second well region surrounding the first well region, wherein the first and second well regions have different conductivity types; and

a third well region surrounding the second well region, wherein the second and third well regions have different conductivity types.

5. A charge pump circuit comprising:

a first charge pump stage that includes:

a first n-channel transistor having a source coupled to a first input terminal and a drain coupled to a first output terminal;

a second n-channel transistor having a source coupled to the first input terminal, a drain coupled to a gate of the first n-channel transistor, and a gate coupled to the first output terminal;

a third n-channel transistor having a source coupled to the first input terminal, a gate coupled to the first output terminal, and a drain coupled to a first p-well;

a fourth n-channel transistor having a source coupled to the first output terminal, a gate coupled to the first input terminal, and a drain coupled to the first p-well, wherein the first, second, third and fourth n-channel transistors are fabricated in the first p-well;

a first capacitor coupled to the first output terminal; and

a second capacitor coupled to the gate of the first n-channel transistor; and

a second charge pump stage that includes:

a fifth n-channel transistor having a source coupled to the first output terminal and a drain coupled to a second output terminal;

a sixth n-channel transistor having a source coupled to the first output terminal, a drain coupled to a gate of the fifth n-channel transistor, and a gate coupled to the second output terminal;

a seventh n-channel transistor having a source coupled to the first output terminal, a gate coupled to the second output terminal, and a drain coupled to a second p-well;

a eighth n-channel transistor having a source coupled to the second output terminal, a gate coupled to the first output terminal, and a drain coupled to the second p-well, wherein the fifth, sixth, seventh and eighth n-channel transistors are fabricated in the second p-well;

a third capacitor coupled to the second output terminal; and

a fourth capacitor coupled to the gate of the fifth n-channel transistor.

6. The charge pump circuit of claim 5 , further comprising:

a first clock terminal for receiving a first clock signal, wherein the first capacitor is coupled between the first output terminal and the first clock terminal;

a second clock terminal for receiving a second clock signal, wherein the second capacitor is coupled between the gate of the first n-channel transistor and the second clock terminal;

a third clock terminal, for receiving a third clock signal, wherein the third capacitor is coupled between the second output terminal and the third clock terminal; and

a fourth clock terminal for receiving a fourth clock signal, wherein the fourth capacitor is coupled between the gate of the fifth n-channel transistor and the fourth clock terminal.

7. The charge pump circuit of claim 5 , further comprising:

an n-well surrounding the first p-well and the second p-well; and

a p-type region surrounding the n-well.

8. A charge pump stage comprising:

a first transistor having a source coupled to an input terminal and a drain coupled to an output terminal;

a second transistor having a source coupled to the input terminal, a drain coupled to a gate of the first transistor, and a gate coupled to the output terminal;

a third transistor having a source coupled to the input terminal, a gate coupled to the output terminal, and a drain coupled to a well region;

a fourth transistor baying a source coupled to the output terminal, a gate coupled to the input terminal, and a drain coupled to the well region, wherein the first and second transistors are fabricated in the well region;

a first capacitor coupled to the output terminal; and

a second capacitor coupled to the gate of the first transistor.

9. The charge pump stage of claim 8 , further comprising:

a first clock terminal for receiving a first clock signal, wherein the first capacitor is coupled between the output terminal and the first clock terminal; and

a second clock terminal for receiving a second clock signal, wherein the second capacitor is coupled between the gate of the first transistor and the second clock terminal.

Assignments (2)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Nov 24, 2010
From: TOWER SEMICONDUCTOR LTD.
To: RPX CORPORATION
Reel/Frame 025421/0241 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Mar 20, 2003
From: ESHEL, NOAM
To: TOWER SEMICONDUCTOR LTD.
Reel/Frame 013910/0879 →
Continuity (1)
Related Publication 20040183114A1 · Sep 23, 2004