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App. No. 10/396,410 · Confirmation No. 6131

METHODS OF POLISHING, INTERCONNECT-FABRICATION, AND PRODUCING SEMICONDUCTOR DEVICES

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2004-03-23 CTMS Miscellaneous Action with shortened statutory period (SSP) 2 View
2004-03-08 IFEE Issue Fee Payment (PTO-85B) 1 View
2004-02-06 RUSH Printer Query form, used by the publications branch 2 View
2004-02-06 XRUSH Internal Response to Printer Query from Technology Center(TC) 2 View
2003-12-17 NOA Notice of Allowance and Fees Due (PTOL-85) 3 View
2003-12-17 NOA Notice of Allowance and Fees Due (PTOL-85) 3 View
2003-12-17 892 List of references cited by examiner 1 View
2003-12-17 IIFW Issue Information including classification, examiner, name, claim, renumbering, etc. 1 View
2003-12-17 FWCLM Index of Claims 1 View
2003-12-17 SRFW Search information including classification, databases and other search related notes 1 View
2003-12-17 A.PE Preliminary Amendment 1 View
2003-12-04 SRNT Examiner's search strategy and results 4 View
2003-03-26 TRNA Transmittal of New Application 1 View
2003-03-26 A.PE Preliminary Amendment 7 View
2003-03-26 SPEC Specification 39 View
2003-03-26 CLM Claims 10 View
2003-03-26 ABST Abstract 1 View
2003-03-26 DRW Drawings-only black and white line drawings 11 View
2003-03-26 OATH Oath or Declaration filed 4 View
2003-03-26 IDS Information Disclosure Statement (IDS) Form (SB08) 3 View
2003-03-26 WFEE Fee Worksheet (SB06) 1 View
2003-03-26 WFEE Fee Worksheet (SB06) 1 View
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Quick Facts
App. No.
10/396,410
Filed
2003-03-26
Granted
2004-06-15
Pub. No.
US20030186497A1
Examiner
DANG, PHUC T
Art Unit
2818
PTA
0 days