A layout device includes a processing type setting part for classifying a layout of a semiconductor integrated circuit in every area in accordance with the percentage voltage drop in the circuit, and for extracting a processing target portion composed of a group of areas, including an area having a percentage voltage drop exceeding a predetermined threshold; a layout generating part for applying layout change processing to alleviate differences of the percentage voltage drops among the areas for circuit components, such as power supply wiring and connecting points in the processing target portion.
1. A layout device comprising:
a processing type setting part for classifying every area of a layout of a semiconductor integrated circuit in accordance with percentage voltage drop in the circuit, and for extracting a processing target portion composed of a group of areas, including an area having a percentage voltage drop exceeding a predetermined threshold;
a layout generating part for applying layout processing to alleviate differences of the percentage voltage drops, among the areas, for circuit components included in the processing target portion; and
a memory for storing, in accordance with the percentage voltage drop, an occupancy rate of dummy cells that act as a placement forbidden area of the circuit cells, wherein the layout generating part places, as layout change processing, the circuit cells after the dummy cells have placed at the occupancy rate read out from the memory in accordance with the percentage voltage drop of each area in the processing target portion.
2. A layout device comprising:
a processing type setting part for classifying every area of a layout of a semiconductor integrated circuit in accordance with percentage voltage drop in the circuit, and for extracting a processing target portion composed of a group of areas, including an area having a percentage voltage drop exceeding a predetermined threshold;
a layout generating part for applying layout processing to alleviate differences of the percentage voltage drops, among the areas, for circuit components included in the processing target portion; and
a memory for storing, in accordance with the percentage voltage drop, an area change rate of dummy cells that act as a placement forbidden area of circuit cells and number of the dummy cells to be placed in proximity to the circuit cells, wherein the layout generating part reads in, as layout change processing, number of dummy cell placements and the area change rate from the memory, in accordance with the percentage voltage drop of each area in the processing target portion, and places the circuit cells, to which the dummy cells having areas changed at the area change rate, are adjacent to the number of dummy cell placements.
3. A layout device comprising:
a processing type setting part for classifying every area of a layout of a semiconductor integrated circuit in accordance with percentage voltage drop in the circuit, and for extracting a processing target portion composed of a group of areas, including an area having a percentage voltage drop exceeding a predetermined threshold;
a layout generating part for applying layout processing to alleviate differences of the percentage voltage drops, among the areas, for circuit components included in the processing target portion; and
a memory for storing, in accordance with the percentage voltage drop, an area change rate of a placement area of the circuit cells, wherein the layout generating part places, as layout change processing, the circuit cells, after an area of the placement area has changed, at the area change rate read out from the memory, in accordance with the percentage voltage drop of each area in the processing target portion.