Method for time-evolving rectilinear contours representing photo masks
View Patent ↗Photomask patterns are represented using contours defined by level-set functions. Given target pattern, contours are optimized such that defined photomask, when used in photolithographic process, prints wafer pattern faithful to target pattern. Optimization utilizes “merit function” for encoding aspects of photolithographic process, preferences relating to resulting pattern (e.g. restriction to rectilinear patterns), robustness against process variations, as well as restrictions imposed relating to practical and economic manufacturability of photomasks.
1. A computer-aided optimization method, comprising:
processing a first level-set function representing a first mask pattern; and
generating a second level-set function representing a second mask pattern;
wherein the second mask pattern comprises a modification of the first mask pattern as indicated by a merit function, and wherein the second mask pattern is constrained to be rectilinear.
2. The method of claim 1 , wherein the merit function indicates similarity or dissimilarity between a target pattern and a wafer pattern, the wafer pattern defined as a pattern likely to result from using the second mask in a photolithography process.
3. The method of claim 1 , wherein the generating step comprises an iterative process, an iteration of the iterative process comprising adding an improvement term to a level-set function, and the choice of the improvement term depending on the merit function.
4. The method of claim 2 , wherein the processing step comprises choosing the first level-set function at random.
5. The method of claim 2 , wherein the processing step comprises choosing the first level-set function to be the same as the target pattern.
6. The method of claim 3 , wherein the magnitude of the improvement term is modified according to one or more iterations of the iterative process.
7. The method of claim 3 , wherein the second mask pattern is constrained to be rectilinear using a projection operator.
8. The method of claim 7 , wherein the merit function indicates a robustness of the second mask pattern with respect to a use of the second mask pattern in a photolithography process.
9. The method of claim 7 , wherein the merit function indicates the probability of the second mask pattern printing correctly when used in a photolithographic process.
10. The method of claim 7 , wherein the first level-set function comprises a distance function.
11. The method of claim 7 , wherein the second mask pattern comprises a chrome region and a glass region.
12. The method of claim 7 , wherein the second mask pattern comprises a chrome region, a glass region, and a phase-shifted glass region.
13. The method of claim 7 , wherein the second mask pattern comprises a glass region and an attenuated phase-shifted region.
14. A computer-aided optimization method, comprising:
processing a first level-set function representing a first mask pattern; and
generating a second level-set function representing a second mask pattern;
wherein the second photomask comprises a modification of the first mask pattern as indicated by a merit function.
15. The method of claim 14 , wherein the merit function indicates similarity or dissimilarity between a target pattern and a wafer pattern, the wafer pattern defined as a pattern likely to result from using the second mask in a photolithography process.
16. The method of claim 14 , wherein the generating step comprises an iterative process, an iteration of the iterative process comprising adding an improvement term to a level-set function, and the choice of the improvement term depending on the merit function.