IP Library › Granted Patent US 7,095,044
Granted Patent B2
US 7,095,044 · App. 10/416,005 · Granted Aug 22, 2006

Field effect transistors and materials and methods for their manufacture

Assignee: Merck Patent GmbH
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Quick Facts
Patent No.
US 7,095,044
App. No.
10/416,005
Granted
Aug 22, 2006
Kind
B2
Abstract

A field effect transistor in which a continuous semiconductor layer comprises: a) an organic semiconductor; and, b) an organic binder which has an inherent conductivity of less than 10 −6 Scm −1 and a permittivity at 1,000 Hz of less than 3.3 and a process for its production comprising: coating a substrate with a liquid layer which comprises the organic semiconductor and a material capable of reacting to form the binder; and, converting the liquid layer to a solid layer comprising the semiconductor and the binder by reacting the material to form the binder.

Claims (43)

1. A field effect transistor in which a continuous semiconductor layer forms a field effect channel between a source electrode and a drain electrode, wherein the continuous semiconductor layer comprises:

a) an organic semiconductor which is a conjugated aromatic molecule containing at least four aromatic rings; and,

b)an organic binder which has an inherent conductivity of less than 10 −6 Scm −1 and a permittivity at 1,000 Hz of less than 3.0;

with the proviso that the organic semiconductor does not comprise 2,5-di-n-octyloxy-1,4-bis((4′,4″-bisstyryl)styrylbenzene)(Ooct-OPV5).

2. A field effect transistor according to claim 1 wherein the organic semiconductor has inherent conductivity of less than 10 −6 Scm −1 .

3. A field effect transistor according to claim 2 wherein the organic binder is a homopolymer of styrene and its molecular weight is less than 20,000 daltons.

4. A field effect transistor according to claim 1 wherein the organic binder has a permittivity of less than 2.8.

5. A process of producing a field effect transistor according to claim 1 which comprises:

a) coating a substrate with a liquid layer which comprises the organic semiconductor, the binder and a solvent or which comprises the organic semiconductor and a material capable of reacting to form the binder; and

b) converting the liquid layer to a solid layer comprising the semiconductor and the binder by evaporating the solvent or by reacting the material to form the binder as the case may be.

6. A field effect transistor in which a continuous semiconductor layer forms a field effect channel between a source electrode and a drain electrode, wherein the continuous semiconductor layer comprises:

a) an organic semiconductor; and,

b) an organic binder which has an inherent conductivity of less than 10 31 6 Scm −1 and a permittivity at 1,000 Hz of less than 3.0;

with the proviso that the organic semiconductor does not comprise 2,5-di-n-octyloxy-4-bis((4′,4″-bisstyryl)styrylbenzene)(Ooct-OPV5) or a liquid crystalline phenyl naphthalene compound.

7. A field effect transistor according to claim 1 or claim 6 wherein said continuous semiconductor layer comprises an organic semiconductor having an inherent conductivity of less than 10 −6 Scm −1 and a field effect mobility of more than 10 −5 cm 2 V −1 s −1 and the organic binder has an inherent conductivity of less than 10 −6 Scm −1 and a permittivity at 1,000 Hz of from 2.0 to 2.8 with the proviso that if the binder is a homopolymer of polystyrene its molecular weight is less than 20,000 daltons and greater than 1,000 daltons.

8. A field effect transistor in which a continuous semiconductor layer forms a field effect channel between a source electrode and a drain electrode, wherein the continuous semiconductor layer comprises:

a) an organic semiconductor; and,

b) an organic binder which has an inherent conductivity of less than 10 31 6 Scm −1 and a permittivity at 1,000 Hz of less than 3.0;

with the proviso that the organic semiconductor does not comprise 2,5-di-n-octyloxy-4-bis((4,′,4″-bisstyryl)styrylbenzene)(Ooct-OPV5), said semiconductor being selected from the group consisting of:

(a) compounds having repeat units of Formula 1:

 where each Y 1 is independently selected from P, S, As, N and Se; Ar 1 and Ar 2 are aromatic groups and Ar 3 is present only if Y 1 is N, P, or As in which case it too is an aromatic group;

(b) conjugated oligomeric and polymeric heterocyclic compounds comprising a repeat unit of an optionally substituted 5-membered ring and terminal groups A 1 and A 2 as shown in Formula 2:

 in which X may be Se, Te, O, S, or —N(R)— where R represents H, optionally substituted alkyl or optionally substituted aryl; R 1 , R 2 , A 1 and A 2 may be independently H, alkyl, alkoxy, thioalkyl, acyl, aryl or substituted aryl, a fluorine atom, a cyano group, a nitro group or an optionally substituted secondary or tertiary alkylamine or arylamine —N(R 3 )(R 4 ), where R 3 and R 4 are independently H, optionally substituted alkyl, optionally substituted aryl, alkoxy or polyalkoxy groups;

(c) oligomers containing a conjugated linking group of Formula 3:

 in which X may be Se, Te, O, S, or —N(R)—, R is as defined above; R 1 , R 2 , A 1 and A 2 as defined above for Formula 2, Linking group L represents —C(T 1 )=C(T 2 )-, —C═C, —N(R′)—, —N═N—, (R′)═N—, —N═C(R′)— with T 1 and T 2 defined as above;

(d) polymers having repeat units of Formula 4:

 in which X, R 1 and R 2 are defined as above;

(e) polymers having repeat units of Formula 7:

 in which X is as defined above and the bridging group A is optionally fluorinated C 1-6 alkyl;

(f) polymers having repeat units of Formula 8:

 in which X, R 1 and R 2 are defined as above;

(g) polymers having the repeat units of Formula 9:

 in which X is as defined above; R 5 and R 6 may be independently H, alkyl, aryl or substituted aryl;

(h) polymers having the repeat units of Formula 10:

 wherein R 5 and R 6 are as defined in Formula 9.

9. A field effect transistor comprising:

an insulator layer,

a gate electrode,

a semiconductor layer,

a source electrode,

a drain electrode,

wherein the semiconductor layer is as defined in any one of the preceding claims.

10. A field effect transistor according to claim 9 , wherein the gate electrode and the semiconductor layer contact the insulator layer, and the source electrode and the drain electrode contact the semiconductor layer.

Assignments (2)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Dec 15, 2005
From: AVECIA LIMITED
To: MERCK PATENT GMBH
Reel/Frame 017124/0673 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded May 6, 2003
From: BROWN, BEVERLEY ANNE; CUPERTINO, DOMENICO CARLO; VERES, JANOS; SCHOFIELD, JOHN DAVID; LEEMING, STEPHEN WILLIAM; YATES, STEPHEN GEORGE
To: AVECIA LIMITED
Reel/Frame 014395/0594 →
Priority Claims (1)
JP 0028867.0 · Nov 28, 2000 · national
Continuity (1)
Related Publication 20040038459A1 · Feb 26, 2004