IP Library Granted Patent US 7,387,827
Granted Patent B2
US 7,387,827 · App. 10/427,168 · Granted Jun 17, 2008

Interconnection designs and materials having improved strength and fatigue life

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Quick Facts
Patent No.
US 7,387,827
App. No.
10/427,168
Granted
Jun 17, 2008
Kind
B2
Abstract

Methods and designs for increasing interconnect areas for interconnect bumps are disclosed. An interconnect bump may be formed on a substrate such that the interconnect bump extends beyond a contact pad onto a substrate. An interconnect bump may be formed on a larger contact pad, the bump having a large diameter.

Claims (9)

1. A device comprising:

a passivation layer on a surface of a substrate having at least one opening;

a contact pad on the surface of the substrate in the opening of the passivation layer; and

an interconnect bump in electrical connection with the contact pad and extending beyond a surface of the contact pad to contact the passivation layer.

2. The device of claim 1 , the substrate further comprising an integrated circuit die.

3. The device of claim 1 , the substrate further comprising an integrated circuit package.

4. The device of claim 1 , the interconnect bump further comprising an electrically conductive polymer.

5. The device of claim 1 , the interconnect bump further comprising a silver-filled epoxy.

6. The device of claim 1 , the interconnect bump further comprising an interconnect bump formed from a material having a modulus in the approximate range of 0.5 to 6 GigaPascals.

Assignments (10)
RELEASE OF SECURITY INTEREST Recorded Nov 12, 2019
From: JPMORGAN CHASE BANK, N.A., AS COLLATERAL AGENT
To: MICRON TECHNOLOGY, INC.; MICRON SEMICONDUCTOR PRODUCTS, INC.
Reel/Frame 051028/0001 →
RELEASE OF SECURITY INTEREST Recorded Oct 9, 2019
From: MORGAN STANLEY SENIOR FUNDING, INC., AS COLLATERAL AGENT
To: MICRON TECHNOLOGY, INC.
Reel/Frame 050937/0001 →
RELEASE OF SECURITY INTEREST Recorded Aug 23, 2018
From: U.S. BANK NATIONAL ASSOCIATION, AS COLLATERAL AGENT
To: MICRON TECHNOLOGY, INC.
Reel/Frame 047243/0001 →
SECURITY INTEREST Recorded Jul 13, 2018
From: MICRON TECHNOLOGY, INC.; MICRON SEMICONDUCTOR PRODUCTS, INC.
To: JPMORGAN CHASE BANK, N.A., AS COLLATERAL AGENT
Reel/Frame 047540/0001 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REPLACE ERRONEOUSLY FILED PATENT #7358718 WITH THE CORRECT PATENT #7358178 PREVIOUSLY RECORDED ON REEL 038669 FRAME 0001. ASSIGNOR(S) HEREBY CONFIRMS THE SECURITY INTEREST. Recorded Jun 8, 2017
From: MICRON TECHNOLOGY, INC.
To: U.S. BANK NATIONAL ASSOCIATION, AS COLLATERAL AGENT
Reel/Frame 043079/0001 →
PATENT SECURITY AGREEMENT Recorded Jun 2, 2016
From: MICRON TECHNOLOGY, INC.
To: MORGAN STANLEY SENIOR FUNDING, INC., AS COLLATERAL AGENT
Reel/Frame 038954/0001 →
SECURITY INTEREST Recorded May 12, 2016
From: MICRON TECHNOLOGY, INC.
To: U.S. BANK NATIONAL ASSOCIATION, AS COLLATERAL AGENT
Reel/Frame 038669/0001 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Feb 1, 2012
From: NUMONYX B.V.
To: MICRON TECHNOLOGY, INC.
Reel/Frame 027632/0001 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jan 11, 2012
From: INTEL CORPORATION
To: NUMONYX B.V.
Reel/Frame 027545/0314 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Apr 30, 2003
From: STERRETT, TERRY LEE; HARRIES, RICHARD J.
To: INTEL CORPORATION
Reel/Frame 014040/0497 →