IP Library Granted Patent US 6,979,626
Granted Patent B2
US 6,979,626 · App. 10/442,449 · Granted Dec 27, 2005

Method for fabricating a self-aligned bipolar transistor having increased manufacturability and related structure

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Quick Facts
Patent No.
US 6,979,626
App. No.
10/442,449
Granted
Dec 27, 2005
Kind
B2
Abstract

According to one exemplary embodiment, a bipolar transistor comprises a base having a top surface. The bipolar transistor further comprises a base oxide layer situated on top surface of the base. The bipolar transistor further comprises a sacrificial post situated on the base oxide layer. The bipolar transistor further comprises a conformal layer situated over the sacrificial post and top surface of the base, where the conformal layer has a density greater than a density of the base oxide layer. The conformal layer may be, for example, HDPCVD oxide. According to this exemplary embodiment, the bipolar transistor further comprises a sacrificial planarizing layer situated over the conformal layer. The sacrificial planarizing layer has a first thickness in a first region between first and second link spacers and a second thickness in a second region outside of first and second link spacers, where the second thickness is generally greater than the first thickness.

Claims (19)

1. A method for fabricating a bipolar transistor, said method comprising steps of:

depositing a base oxide layer on a top surface of a base;

fabricating a sacrificial post on said base oxide layer;

forming a conformal layer over said sacrificial post, said conformal layer having a density greater than a density of said base oxide layer;

depositing a sacrificial planarizing layer over said conformal layer and said base, wherein said sacrificial planarizing layer comprises an organic BARC.

2. A method for fabricating a bipolar transistor, said method comprising steps of:

depositing a base oxide layer on a top surface of a base;

fabricating a sacrificial post on said base oxide layer;

forming a conformal layer over said sacrificial post, said conformal layer having a density greater than a density of said base oxide layer;

depositing a sacrificial planarizing layer over said conformal layer and said base;

depositing a mask over said sacrificial planarizing layer;

patterning an emitter window opening in said mask, wherein said emitter window opening has a width greater than a width of said sacrificial post.

3. A method for fabricating a bipolar transistor, said method comprising steps of:

depositing a base oxide layer on a top surface of a base;

fabricating a sacrificial post on said base oxide layer;

forming a conformal layer over said sacrificial post, said conformal layer having a density greater than a density of said base oxide layer;

depositing a sacrificial planarizing layer over said conformal layer and said base;

depositing a mask over said sacrificial planarizing layer;

patterning an emitter window opening in said mask, wherein said emitter window opening has a width smaller than a width of said sacrificial post.

Assignments (1)
RELEASE OF SECURITY INTEREST Recorded Oct 18, 2023
From: WELLS FARGO CAPITAL FINANCE, LLC, AS SUCCESSOR BY MERGER TO WACHOVIA CAPITAL FINANCE CORPORATION (WESTERN)
To: NEWPORT FAB, LLC DBA JAZZ SEMICONDUCTOR OPERATING COMPANY
Reel/Frame 065284/0123 →