IP Library Granted Patent US 7,022,996
Granted Patent B2
US 7,022,996 · App. 10/443,225 · Granted Apr 4, 2006

Radiation detector

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Quick Facts
Patent No.
US 7,022,996
App. No.
10/443,225
Granted
Apr 4, 2006
Kind
B2
Abstract

In order to provide a radiation detector capable of implementing measurements with a good energy resolution and a high detection efficiency over a broad energy range using a single detector, in the present invention, a radiation detecting element composed of Si semiconductor and the radiation detecting element composed of CdZnTe or CdTe semiconductor are lined up as two layers longitudinally. The radiation detecting element composed of Si semiconductor is taken as a first layer at the side of incidence of the radiation and the radiation detecting element composed of CdZnTe or CdTe semiconductor is taken as a second layer.

Claims (14)

1. A radiation detector for detecting incident radiation, comprising:

a first radiation detection element composed of Si semiconductor, the first radiation detection element comprising an Si-PIN diode detection element; and

a second radiation detection element composed of CdZnTe or CdTe semiconductor, the second radiation detection element overlapping the first radiation detection element in such a manner that the first radiation detection element is on the side of the incident radiation.

2. A radiation detector for detecting incident radiation, comprising:

a first radiation detection element composed of Si semiconductor, the first radiation detection element comprising an Si(Li) detection element; and

a second radiation detection element composed of CdZnTe or CdTe semiconductor, the second radiation detection element overlapping the first radiation detection element in such a manner that the first radiation detection element is on the side of the incident radiation.

3. A radiation detector for detecting incident radiation, comprising:

a first radiation detection element composed of Si semiconductor; and

a second radiation detection element composed of CdZnTe or CdTe semiconductor, the second radiation detection element overlapping the first radiation detection element in such a manner that the first radiation detection element is on the side of the incident radiation;

wherein the first radiation detection element and the second radiation detection element overlap each other via an insulating body.

4. A radiation detector for detecting incident radiation, comprising:

a first radiation detection element composed of Si semiconductor; and

a second radiation detection element composed of CdZnTe or CdTe semiconductor, the second radiation detection element overlapping the first radiation detection element in such a manner that the first radiation detection element is on the side of the incident radiation;

wherein the first radiation detection element and the second radiation detection element overlap each other via an intervening vacuum or an inert gas.

Assignments (2)
CHANGE OF NAME Recorded Sep 25, 2014
From: SII NANOTECHNOLOGY INC.
To: HITACHI HIGH-TECH SCIENCE CORPORATION
Reel/Frame 033817/0078 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Feb 2, 2006
From: MATOBA, YOSHIKI; KIMURA, KAZUHIKO
To: SII NANOTECHNOLOGY INC.
Reel/Frame 017516/0979 →