IP Library › Granted Patent US 7,057,404

Granted Patent B2

US 7,057,404 · App. 10/445,174 · Granted Jun 6, 2006

Shielded probe for testing a device under test

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Quick Facts

Patent No.: US 7,057,404
App. No.: 10/445,174
Granted: Jun 6, 2006
Kind: B2

External Links

USPTO Patent Center↗ Full Patent PDF↗

Abstract

A probe measurement system for measuring the electrical characteristics of integrated circuits or other microelectronic devices at high frequencies. The probe measurement system preferably includes a probe having a conductive path between the first and second sides of a substrate and a probe contact electrically connected to the conductive path.

Claims (53)

1. A probe comprising:

(a) a dielectric substrate;

(b) an elongate conductor suitable to be electrically interconnected to a test signal supported by a first side of said substrate;

(c) a conductive member suitable to be electrically interconnected to a ground signal supported by said second side of said substrate wherein said conductive member is under a majority of the length of said elongate conductor;

(d) a conductive path between said first side of said substrate and said second side of said substrate in a manner free from an air gap between the conductive path and the end of said substrate for at least a majority of the thickness of said substrate and said conductive path free from electrical interconnection with said conductive member; and

(e) a contact electrically interconnected to said conductive path for testing a device under test.

2. The probe of claim 1 wherein said elongate conductor is electrically interconnected to a central conductor of a coaxial cable.

3. The probe of claim 2 wherein said conductive member is electrically connected to a conductor surrounding said central conductor of said coaxial cable.

4. The probe of claim 3 wherein said substrate is supported by said coaxial cable.

5. The probe of claim 4 wherein said substrate is supported by a shelf of said coaxial cable.

6. The probe of claim 1 wherein said conductive member is substantially planar.

7. The probe of claim 1 wherein said dielectric substrate is semi-flexible.

8. The probe of claim 7 wherein said dielectric substrate is a membrane.

9. The probe of claim 1 wherein said dielectric substrate has a dielectric constant less than 7.

10. The probe of claim 1 wherein said dielectric substrate has a dielectric constant less than 5.

11. The probe of claim 1 wherein said dielectric substrate has a dielectric constant less than 4.

12. The probe of claim 1 wherein said dielectric substrate has a dielectric constant less than 2.

13. The probe of claim 1 wherein said ground signal is zero volts.

14. The probe of claim 1 wherein said conductive member covers greater than 50% of said second side of said substrate.

15. The probe of claim 1 wherein said conductive member covers greater than 60% of said second side of said substrate.

16. The probe of claim 1 wherein said conductive member covers greater than 70% of said second side of said substrate.

17. The probe of claim 1 wherein said conductive member covers greater than 80% of said second side of said substrate.

18. The probe of claim 1 wherein said conductive member covers greater than 90% of said second side of said substrate.

19. The probe of claim 1 wherein said conductive member, said elongate conductor, and said substrate collectively form a microstrip transmission structure.

20. The probe of claim 1 wherein said conductive path is a via through said substrate.

21. The probe of claim 1 wherein said conductive member laterally surrounds at least 50% of said contact.

22. The probe of claim 1 wherein said conductive member laterally surrounds at least 75% of said contact.

23. The probe of claim 1 wherein said conductive member laterally surrounds at least 100% of said contact.

24. The probe of claim 1 wherein said contact is in the form of a bump.

25. The probe of claim 1 wherein said substrate has a thickness less than 40 microns.

26. The probe of claim 1 wherein said substrate has a thickness less than 30 microns.

27. The probe of claim 1 wherein said substrate has a thickness less than 20 microns.

28. A probe comprising:

(a) a dielectric substrate supporting an elongate conductor on a first side of said substrate and a conductive member supported by said second side of said substrate wherein said conductive member is under a majority of the length of said elongate conductor;

(b) a conductive path between said first side of said substrate and said second side of said substrate in a region within the periphery of said substrate for at least a majority of the thickness of said substrate; and

29. The probe of claim 28 wherein said elongate conductor is electrically interconnected to a central conductor of a coaxial cable.

30. The probe of claim 29 wherein said conductive member is electrically connected to a conductor surrounding said central conductor of said coaxial cable.

31. The probe of claim 28 wherein said dielectric substrate is flexible.

32. The probe of claim 31 wherein said dielectric substrate is a membrane.

33. The probe of claim 28 wherein said dielectric substrate has a dielectric constant less than 7.

34. The probe of claim 28 wherein said dielectric substrate has a dielectric constant less than 5.

35. The probe of claim 28 wherein said dielectric substrate has a dielectric constant less than 4.

36. The probe of claim 28 wherein said dielectric substrate has a dielectric constant less than 2.

37. The probe of claim 28 wherein said conductive member covers greater than 50% of said second side of said substrate.

38. The probe of claim 28 wherein said conductive member covers greater than 60% of said second side of said substrate.

39. The probe of claim 28 wherein said conductive member covers greater than 70% of said second side of said substrate.

40. The probe of claim 28 wherein said conductive member covers greater than 80% of said second side of said substrate.

41. The probe of claim 28 wherein said conductive member covers greater than 90% of said second side of said substrate.

42. The probe of claim 28 wherein said conductive member, said elongate conductor, and said substrate collectively form a microstrip transmission structure.

43. The probe of claim 28 wherein said substrate has a thickness less than 40 microns.

44. The probe of claim 28 wherein said substrate has a thickness less than 20 microns.

45. The probe of claim 28 wherein said substrate has a thickness less than 10 microns.

Assignments (1)

CHANGE OF NAME Recorded Mar 13, 2019

From: CASCADE MICROTECH, INC.

To: FORMFACTOR BEAVERTON, INC.

Reel/Frame 049949/0542 →