Patent Assignment
Reel/Frame 049949/0542
Change of Name
Recorded: 2019-03-13
Pages: 4
Assignor
CASCADE MICROTECH, INC.
Executed: 2018-05-14
Assignee
FORMFACTOR BEAVERTON, INC.
9100 SW GEMINI DRIVE, BEAVERTON, OREGON, 97008
Covered Properties
(48)
Probe Station Thermal Chuck with Shielding for Capacitive Current
Patent:
6,445,202 →
Application:
09/345,571 →
A Method for Conctructing a Membrane Probe Using a Depression
Patent:
6,578,264 →
Application:
09/546,927 →
Probe Station Thermal Chuck with Shielding for Capacitive Current
Membrane Probing System
Method for Constructing a Membrane Probe Using a Depression
Shielded Probe for Testing a Device Under Test
Membrane Probing System
Membrane Probing System
Optically enhanced digital imaging system
Application:
11/263,592 →
Publication:
US 2006/0092505
Membrane Probing System
Method of Constructing a Membrane Probe
Method of constructing a membrane probe using a depression
Application:
12/378,650 →
Publication:
US 2009/0178277
Membrane Probing System
Application:
60/137,759 →
Membrane probing system
Application:
60/184,851 →
Wafer probe
Application:
60/251,186 →
Membrane probing system
Application:
60/314,155 →
Probe station with low noise characteristics
Application:
60/424,986 →
Probe station with low inductance path
Application:
60/429,082 →
Probe head having a membrane suspended probe
Application:
60/586,299 →
Digital optical probe system
Application:
60/624,326 →
Microscope system for testing semiconductors
Application:
60/648,747 →
Microscope system for testing semiconductors
Application:
60/648,952 →
Wideband hybrid active-passive differential signal probe
Application:
60/690,109 →
Wideband hybrid active-passive differential signal probe
Application:
60/739,397 →
On-wafer test structures
Application:
60/813,099 →
Line-Reflect-Reflect Match calibration
Application:
60/831,940 →
Line-reflect-reflect match calibration
Application:
60/851,254 →
Replaceable coupon for a probing apparatus
Application:
61/199,910 →
Test system for flicker noise
Application:
61/200,187 →
Probe Station with Improved Interconnection
Application:
61/306,878 →
System for Testing Semiconductors
Application:
61/313,607 →
High Voltage Chuck for a Probe Station
Application:
61/352,061 →
High Voltage Chuck for a Probe Station
Application:
61/377,423 →
Optical Testing System
Application:
61/394,914 →
Probing Apparatus with a Coupon
Application:
61/410,242 →
Membrane Based Probing Apparatus
Application:
61/484,116 →
High Frequency Interconnection
Application:
61/493,314 →
Systems and Methods for Testing Electronic Devices That Include Low Power Output Drivers
Application:
61/723,401 →
Systems and Methods for Handling Wafers at Below Dew Point Temperatures
Application:
61/747,686 →
Systems and Methods for Providing Wafer Access in a Wafer Processing System
Application:
61/747,703 →
Systems and Methods for Testing Electronic Devices That Include Low Power Output Drivers
Application:
61/876,680 →
Systems and Methods for on-Wafer Dynamic Testing of Electronic Devices
Application:
61/944,461 →
Wafer-Handling End Effectors
Application:
61/949,096 →
Probe Systems and Methods for Automatically Maintaining Alignment Between a Probe and a Device Under Test During a Temperature Change
Application:
62/259,814 →
Methods for Wafer-Level Testing Over Extended Temperature Ranges
Application:
62/317,168 →
Contact Engines, Probe Head Assemblies, and Probe Systems for on-Wafer Testing of the Wireless Operation of a Device Under Test
Application:
62/428,297 →
Probe Systems and Methods Including Electric Contact Detection
Application:
62/481,245 →
Probe Stations, Probe Systems Including the Probe Stations, and Methods for Controlling the Operation of Probe Stations
Application:
62/510,127 →
Related Assignments
(5)
Other recorded transfers of the patents in this record — the chain of ownership.
Assignment of Assignor's Interest
Aug 16, 2012
From: NEGISHI, KAZUKI; SWE, TOENAING; RODGERS, JORDAN; SIMMONS, MICHAEL
To: CASCADE MICROTECH, INC.
Reel/Frame 028797/0252 →
Security Interest in United States Patents and Trademarks
Jul 12, 2016
From: FORMFACTOR, INC.; ASTRIA SEMICONDUCTOR HOLDINGS, INC.; CASCADE MICROTECH, INC.; MICRO-PROBE INCORPORATED
To: HSBC BANK USA, NATIONAL ASSOCIATION
Reel/Frame 039184/0280 →
Change of Name
Jul 18, 2018
From: CASCADE MICROTECH, INC.
To: FORMFACTOR BEAVERTON, INC.
Reel/Frame 046573/0664 →
Merger
Apr 7, 2021
From: FORMFACTOR BEAVERTON, INC.
To: FORMFACTOR, INC.
Reel/Frame 055859/0687 →
Release of Security Interest
Aug 7, 2025
From: HSBC BANK USA, NATIONAL ASSOCIATION
To: FORMFACTOR, INC.
Reel/Frame 072853/0001 →