IP Library › Patent Application 62317168
Patent Application Provisional
App. No. 62/317,168 · Confirmation No. 4696

METHODS FOR WAFER-LEVEL TESTING OVER EXTENDED TEMPERATURE RANGES

Provisional Application Expired
⬇ PDF
 Code Description Pages PDF
2016-04-19 APP.FILE.REC Filing Receipt 3 View
2016-04-01 PA.. Power of Attorney 1 View
2016-04-01 SPEC Specification 24 View
2016-04-01 ABST Abstract 1 View
2016-04-01 DRW Drawings-only black and white line drawings 4 View
2016-04-01 WFEE Fee Worksheet (SB06) 2 View
2016-04-01 N417 Electronic Filing System Acknowledgment Receipt 3 View
2016-04-01 TR.PROV Provisional Cover Sheet (SB16) 2 View
2016-04-01 ADS Application Data Sheet 6 View
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Quick Facts
App. No.
62/317,168
Filed
2016-04-01