IP Library Granted Patent US 7,151,713
Granted Patent B2
US 7,151,713 · App. 10/445,522 · Granted Dec 19, 2006

Semiconductor memory device

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Quick Facts
Patent No.
US 7,151,713
App. No.
10/445,522
Granted
Dec 19, 2006
Kind
B2
Abstract

A semiconductor memory device has a command decoder responsive to a plurality of commands to set the semiconductor memory device to a normal mode, for generating control signals corresponding to the commands, respectively, and a row address prelatch circuit for holding a row address except for a bank address input together with a precharge command, and outputting the row address to a row address latch circuit, when the semiconductor memory device is in a test mode. The row address latch circuit holds the row address output from the row address prelatch circuit in synchronism with a control signal which is generated when an active command is input. The column address latch circuit holds the column address which has already been input when the active command is input, in synchronism with a control signal which is generated when either a read command or a write command is input.

Claims (6)

1. A semiconductor memory device comprising:

a row address latch circuit for holding a row address input from an external source in synchronism with a timing signal having a predetermined pulse interval;

a column address latch circuit for holding a column address input from an external source in synchronism with said timing signal;

a command decoder responsive to an MRS command to set the semiconductor memory device to a test mode, for generating a test mode signal for a predetermined period, and also responsive to a plurality of commands to set the semiconductor memory device to a normal mode, for generating control signals corresponding to the commands, respectively; and

a row address prelatch circuit for holding a row address except for a bank address input together with a precharge command, and outputting the row address to said row address latch circuit, when said semiconductor memory device is in said test mode.

2. The semiconductor memory device according to claim 1 , wherein said row address latch circuit holds the row address output from said row address prelatch circuit in synchronism with a control signal which is generated when an active command is input, and said column address latch circuit holds the column address which has already been input when said active command is input, in synchronism with a control signal which is generated when either a read command or a write command is input.

Assignments (6)
CHANGE OF NAME Recorded Aug 24, 2016
From: PS5 LUXCO S.A.R.L.
To: LONGITUDE SEMICONDUCTOR S.A.R.L.
Reel/Frame 039793/0880 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Aug 24, 2016
From: PS4 LUXCO S.A.R.L.
To: PS5 LUXCO S.A.R.L.
Reel/Frame 039818/0506 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded May 15, 2014
From: ELPIDA MEMORY, INC.
To: PS4 LUXCO S.A.R.L.
Reel/Frame 032894/0588 →
RELEASE OF SECURITY INTEREST Recorded Feb 24, 2014
From: APPLE, INC
To: ELPIDA MEMORY, INC.
Reel/Frame 032331/0637 →
SECURITY AGREEMENT Recorded Jul 29, 2013
From: PS4 LUXCO S.A.R.L.
To: ELPIDA MEMORY INC.
Reel/Frame 032414/0261 →
SECURITY AGREEMENT Recorded May 15, 2012
From: ELPIDA MEMORY, INC.
To: APPLE INC.
Reel/Frame 028209/0477 →