Granted Patent
Utility
US 6,781,762
· Confirmation No. 1671
METHOD OF MANUFACTURING MICROLENS, MICROLENS, MICROLENS ARRAY PLATE, ELECTROOPTIC DEVICE AND ELECTRONIC EQUIPMENT
Inventor:
Norihiko Ozawa
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⬇ PDF
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Code | Description | Pages | ||
|---|---|---|---|---|---|
| 2004-07-13 | IFEE |
Issue Fee Payment (PTO-85B) | 1 | View | |
| 2004-06-01 | NOA |
Notice of Allowance and Fees Due (PTOL-85) | 3 | View | |
| 2004-06-01 | NOA |
Notice of Allowance and Fees Due (PTOL-85) | 3 | View | |
| 2004-06-01 | IIFW |
Issue Information including classification, examiner, name, claim, renumbering, etc. | 1 | View | |
| 2004-06-01 | SRFW |
Search information including classification, databases and other search related notes | 1 | View | |
| 2004-06-01 | FWCLM |
Index of Claims | 1 | View | |
| 2004-06-01 | SRNT |
Examiner's search strategy and results | 4 | View | |
| 2004-05-27 | WFEE |
Fee Worksheet (SB06) | 1 | View | |
| 2004-05-27 | SRNT |
Examiner's search strategy and results | 1 | View | |
| 2004-05-19 | A... |
Amendment/Request for Reconsideration-After Non-Final Rejection | 1 | View | |
| 2004-05-19 | CLM |
Claims | 2 | View | |
| 2004-05-19 | REM |
Applicant Arguments/Remarks Made in an Amendment | 1 | View | |
| 2004-04-23 | CTEQ |
Ex Parte Quayle Action | 5 | View | |
| 2004-04-23 | 1449 |
List of References cited by applicant and considered by examiner | 1 | View | |
| 2004-04-23 | 892 |
List of references cited by examiner | 1 | View | |
| 2004-04-23 | FWCLM |
Index of Claims | 1 | View | |
| 2004-04-23 | SRFW |
Search information including classification, databases and other search related notes | 1 | View | |
| 2004-04-23 | SRNT |
Examiner's search strategy and results | 4 | View | |
| 2004-03-26 | WFEE |
Fee Worksheet (SB06) | 1 | View | |
| 2004-03-26 | FWCLM |
Index of Claims | 1 | View | |
| 2004-03-22 | ELC. |
Response to Election / Restriction Filed | 1 | View | |
| 2004-03-22 | CLM |
Claims | 2 | View | |
| 2004-03-22 | REM |
Applicant Arguments/Remarks Made in an Amendment | 1 | View | |
| 2004-02-26 | CTRS |
Requirement for Restriction/Election | 5 | View | |
| 2004-02-26 | SRFW |
Search information including classification, databases and other search related notes | 1 | View | |
| 2004-02-26 | FWCLM |
Index of Claims | 1 | View | |
| 2004-02-26 | EXIN |
Examiner Interview Summary Record (PTOL - 413) | 2 | View | |
| 2003-09-30 | OATH |
Oath or Declaration filed | 3 | View | |
| 2003-07-31 | PEFN |
Pre-Exam Formalities Notice | 1 | View | |
| 2003-06-04 | TRNA |
Transmittal of New Application | 1 | View | |
| 2003-06-04 | ADS |
Application Data Sheet | 1 | View | |
| 2003-06-04 | SPEC |
Specification | 22 | View | |
| 2003-06-04 | CLM |
Claims | 2 | View | |
| 2003-06-04 | ABST |
Abstract | 1 | View | |
| 2003-06-04 | DRW |
Drawings-only black and white line drawings | 9 | View | |
| 2003-06-04 | WFEE |
Fee Worksheet (SB06) | 1 | View | |
| 2003-06-04 | WFEE |
Fee Worksheet (SB06) | 1 | View | |
| 2003-06-04 | IDS |
Information Disclosure Statement (IDS) Form (SB08) | 2 | View | |
| 2003-06-04 | FOR |
Foreign Reference | 7 | View | |
| 2003-06-04 | FOR |
Foreign Reference | 11 | View | |
| 2003-06-04 | FOR |
Foreign Reference | 17 | View | |
| 2003-06-04 | FOR |
Foreign Reference | 19 | View | |
| 2003-06-04 | FRPR |
Certified Copy of Foreign Priority Application | 41 | View | |
| 2003-06-04 | FRPR |
Certified Copy of Foreign Priority Application | 40 | View |
Inventors
Norihiko Ozawa
Shiojiri-shi, JAPAN
Attorneys & Agents of Record
Classification
USPC
359/618
G02B3/0056
H10F39/8063
G02B3/0012
G02B3/0031
G02F1/133526
G03F7/0005
Prosecution
- Examiner
- DINH, JACK
- Art Unit
- 2873
- Customer No.
- 25944
- Docket No.
- 115990
- Confirmation No.
- 1671
Foreign Priority
2002-171892
·
2002-06-12
·
JAPAN
2003-129252
·
2003-05-07
·
JAPAN
Publication
- Pub. No.
- US20040027680A1
- Pub. Date
- 2004-02-12
Patent Term Adjustment
-3days
ASSIGNMENT OF ASSIGNOR'S INTEREST
Recorded 2018-07-16
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Quick Facts
- Patent No.
- US 6,781,762
- App. No.
- 10/453,692
- Filed
- 2003-06-04
- Granted
- 2004-08-24
- Pub. No.
- US20040027680A1
- Examiner
- DINH, JACK
- Art Unit
- 2873
- PTA
- -3 days
External Links