IP Library Granted Patent US 7,057,288
Granted Patent B2
US 7,057,288 · App. 10/459,616 · Granted Jun 6, 2006

Electric device and method for fabricating the same

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Quick Facts
Patent No.
US 7,057,288
App. No.
10/459,616
Granted
Jun 6, 2006
Kind
B2
Abstract

A wiring groove is formed in an insulating film, and then a reformed layer is formed in the vicinity of the wiring groove in the insulating film. Thereafter, a conductive film is buried in the wiring groove, thereby forming a wire. Subsequently, the reformed layer is removed to form a slit, and then a low-dielectric-constant film having a relative dielectric constant lower than the insulating film is buried in the slit.

Claims (60)

1. An electric device comprising:

a layer having a plurality of first wirings and a plurality of second wirings;

a first low-dielectric-constant film formed in a space between at least one adjacent pair of the first wirings; and

a second low-dielectric-constant film formed in a space between at least one adjacent pair of the second wirings,

wherein the top surface of the second low-dielectric-constant film is substantially at the same level as the top surface of the second wirings,

the space between the adjacent pair of the first wirings is narrower than the space between the adjacent pair of the second wirings,

the second low-dielectric-constant film has a mechanical strength higher than that of the first low-dielectric-constant film, and

the first low-dielectric-constant film is formed in the space between the adjacent pair of the second wirings.

2. An electric device comprising:

a layer having a plurality of first wirings and a plurality of second wirings;

a first low-dielectric-constant film including a carbon formed in a space between at least one adjacent pair of the first wirings; and

a second low-dielectric-constant film including a carbon formed in a space between at least one adjacent pair of the second wirings,

wherein the space between the adjacent pair of the first wirings is narrower than the space between the adjacent pair of the second wirings, and

a carbon concentration of the first low-dielectric-constant film is higher than that of the second low-dielectric-constant film.

3. An electric device comprising:

a layer having a plurality of first wirings and a plurality of second wirings;

a first low-dielectric-constant film having a hardness of 0.1 GPa formed in a space between at least one adjacent pair of the first wirings; and

a second low-dielectric-constant film having a hardness of 1.5 GPa formed in a space between at least one adjacent pair of the second wirings,

wherein the space between the adjacent pair of the first wirings is narrower than the space between the adjacent pair of the second wirings.

4. The electric device of claim 2 , wherein the first low-dielectric-constant film is formed in the space between the adjacent pair of the second wirings.

5. The electric device of claim 3 , wherein the first low-dielectric-constant film is formed in the space between the adjacent pair of the second wirings.

6. The electric device of claim 1 , wherein the first low-dielectric-constant film is in contact with each side of the plurality of first wirings and the plurality of second wirings.

7. The electric device of claim 4 , wherein the first low-dielectric-constant film is in contact with each side of the plurality of first wirings and the plurality of second wirings.

8. The electric device of claim 1 , wherein a silicon carbide layer is formed on said layer.

9. The electric device of claim 2 , wherein a silicon carbide layer is formed on said layer.

10. The electric device of claim 1 , wherein a distance between at least one adjacent pair of the first wirings is 100 nm or less.

11. The electric device of claim 2 , wherein a distance between at least one adjacent pair of the first wirings is 100 nm or less.

12. The electric device of claim 1 , wherein the first low-dielectric-constant film and the second low-dielectric-constant film are carbon-containing silicon oxide films, and

a carbon concentration of the first low-dielectric-constant film is higher than that of the second low-dielectric-constant film.

13. The electric device of claim 2 , wherein the first low-dielectric-constant film and the second low-dielectric-constant film are carbon-containing silicon oxide films.

14. The electric device of claim 3 , wherein the first low-dielectric-constant film and the second low-dielectric-constant film are carbon-containing silicon oxide films, and

a carbon concentration of the first low-dielectric-constant film is higher than that of the second low-dielectric-constant film.

15. The electric device of claim 1 , wherein the first low-dielectric-constant film has a relative dielectric constant of substantially 2.0 or less, and

the second low-dielectric-constant film has a relative dielectric constant of substantially 3.0 or more.

16. The electric device of claim 2 , wherein the first low-dielectric-constant film has a relative dielectric constant of substantially 2.0 or less, and

the second low-dielectric-constant film has a relative dielectric constant of substantially 3.0 or more.

17. The electric device of claim 1 , wherein the first low-dielectric-constant film has a hardness of substantially 0.1 GPa, and

the second low-dielectric-constant film has a hardness of substantially 1.5 GPa.

18. The electric device of claim 1 , wherein the first low-dielectric-constant film is a carbon-containing silicon oxide film, a carbon-containing silicon nitride film, a CDO film, an organic film, an HSQ film or an MSQ film.

19. The electric device of claim 2 , wherein the first low-dielectric-constant film is a carbon-containing silicon oxide film, a carbon-containing silicon nitride film, a CDO film, an organic film, an HSQ film or an MSQ film.

20. The electric device of claim 1 , wherein the space between at least one adjacent pair of the first wirings is completely filled with the first low-dielectric-constant film.

21. The electric device of claim 2 , wherein the space between at least one adjacent pair of the first wirings is completely filled with the first low-dielectric-constant film.

22. An electric device comprising:

a layer having a plurality of first wirings and a plurality of second wirings;

a first low-dielectric-constant film formed in a space between at least one adjacent pair of the first wirings; and

a second low-dielectric-constant film formed in a space between at least one adjacent pair of the second wirings,

wherein the top surface of the second low-dielectric-constant film is substantially at the same level as the top surface of the second wirings,

the space between the adjacent pair of the first wirings is narrower than the space between the adjacent pair of the second wirings,

the second low-dielectric-constant film has a mechanical strength higher than that of the first low-dielectric-constant film,

the first low-dielectric-constant film and the second low-dielectric-constant film are carbon-containing silicon oxide films, and

a carbon concentration of the first low-dielectric-constant film is higher than that of the second low-dielectric-constant film.

23. An electric device comprising:

a layer having a plurality of first wirings and a plurality of second wirings;

a first low-dielectric-constant film formed in a space between at least one adjacent pair of the first wirings; and

a second low-dielectric-constant film formed in a space between at least one adjacent pair of the second wirings,

wherein the top surface of the second low-dielectric-constant film is substantially at the same level as the top surface of the second wirings,

the space between the adjacent pair of the first wirings is narrower than the space between the adjacent pair of the second wirings,

the second low-dielectric-constant film has a mechanical strength higher than that of the first low-dielectric-constant film,

the first low-dielectric-constant film has a hardness of substantially 0.1 GPa, and

the second low-dielectric-constant film has a hardness of substantially 1.5 GPa.

Assignments (7)
RELEASE OF SECURITY INTEREST Recorded Oct 26, 2020
From: JEFFERIES FINANCE LLC
To: RPX CORPORATION
Reel/Frame 054486/0422 →
SECURITY INTEREST Recorded Jun 29, 2018
From: RPX CORPORATION
To: JEFFERIES FINANCE LLC
Reel/Frame 046486/0433 →
RELEASE (REEL 038041 / FRAME 0001) Recorded Jan 2, 2018
From: JPMORGAN CHASE BANK, N.A.
To: RPX CORPORATION; RPX CLEARINGHOUSE LLC
Reel/Frame 044970/0030 →
SECURITY AGREEMENT Recorded Mar 9, 2016
From: RPX CORPORATION; RPX CLEARINGHOUSE LLC
To: JPMORGAN CHASE BANK, N.A., AS COLLATERAL AGENT
Reel/Frame 038041/0001 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded May 5, 2014
From: PANASONIC CORPORATION (FORMERLY KNOWN AS MATSUSHITA ELECTRIC INDUSTRIAL, CO., LTD.)
To: RPX CORPORATION
Reel/Frame 032826/0585 →
CHANGE OF NAME Recorded Jan 10, 2014
From: MATSUSHITA ELECTRIC INDUSTRIAL CO., LTD.
To: PANASONIC CORPORATION
Reel/Frame 031961/0079 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jun 12, 2003
From: YUASA, HIROSHI
To: MATSUSHITA ELECTRIC INDUSTRIAL CO., LTD.
Reel/Frame 014179/0113 →