IP Library Patent Application 10464769
Patent Application Utility
App. No. 10/464,769 · Confirmation No. 3241

Quality control method and system on production line for fabricating products

Inventor: Naoko Takanabe
Abandoned -- Failure to Respond to an Office Action View Publication ↗
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Code Description Pages PDF
2005-06-27 ABN Abandonment 2 View
2004-12-16 CTFR Final Rejection 8 View
2004-12-16 FWCLM Index of Claims 1 View
2004-12-16 SRFW Search information including classification, databases and other search related notes 1 View
2004-11-23 A... Amendment/Request for Reconsideration-After Non-Final Rejection 2 View
2004-11-23 REM Applicant Arguments/Remarks Made in an Amendment 3 View
2004-09-10 CTNF Non-Final Rejection 7 View
2004-09-10 1449 List of References cited by applicant and considered by examiner 1 View
2004-09-10 892 List of references cited by examiner 1 View
2004-09-10 FWCLM Index of Claims 1 View
2004-09-10 SRFW Search information including classification, databases and other search related notes 1 View
2003-09-04 W/AC Letter Withdrawing/Vacating Office Action 1 View
2003-08-07 PEFN Pre-Exam Formalities Notice 2 View
2003-06-19 TRNA Transmittal of New Application 2 View
2003-06-19 ADS Application Data Sheet 3 View
2003-06-19 A.PE Preliminary Amendment 8 View
2003-06-19 SPEC Specification 19 View
2003-06-19 CLM Claims 5 View
2003-06-19 ABST Abstract 1 View
2003-06-19 DRW Drawings-only black and white line drawings 5 View
2003-06-19 OATH Oath or Declaration filed 3 View
2003-06-19 WFEE Fee Worksheet (SB06) 1 View
2003-06-19 IDS Information Disclosure Statement (IDS) Form (SB08) 5 View
2003-06-19 FOR Foreign Reference 32 View
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Quick Facts
App. No.
10/464,769
Filed
2003-06-19
Pub. No.
US20030229464A1
Examiner
LAU, TUNG S
Art Unit
2863