IP Library Granted Patent US 6,984,572
Granted Patent B2
US 6,984,572 · App. 10/473,980 · Granted Jan 10, 2006

Method for manufacturing electronic component

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Quick Facts
Patent No.
US 6,984,572
App. No.
10/473,980
Granted
Jan 10, 2006
Kind
B2
Abstract

An electronic circuit is manufactured by the following method. Elements are formed on a front surface of a substrate, and then, a recess is formed around each of the elements in the front surface of the substrate. Then, a portion of the substrate is removed from a back surface of the substrate until reaching the bottom of the recess. In the method, the elements are separated at once by removing the portion of the substrate from the back surface, and thus, the elements are manufactured efficiently.

Claims (44)

1. A method of manufacturing an electronic device, comprising:

forming an element on a front surface of a substrate;

providing a recess in the front surface of the substrate around the element;

removing a portion of the substrate from a back surface of the substrate until reaching the recess; and

bonding a dummy substrate to the front surface of the substrate by an adhesive layer comprising thermoplastic resin.

2. The method according to claim 1 ,

wherein said providing of the recess includes

providing a resist mask on the front surface of the substrate to be provided with the recess, and

etching the front surface of the substrate through the resist mask,

said method further comprising

removing the resist mask.

3. The method according to claim 2 , wherein said removing of the resist mask is executed after said removing of the portion of the substrate.

4. The method according to claim 2 , wherein said etching of the front surface of the substrate includes dry-etching the front surface.

5. The method according to claim 4 , wherein said dry-etching of the front surface includes dry-etching the front surface by using a first gas and a second gas.

6. The method according to claim 5 , wherein the first gas contains gas for facilitating dry-etching, and the second gas contains gas for suppressing dry-etching.

7. The method according to claim 6 , wherein said dry-etching of the front surface includes dry-etching the front surface by using a gas mixture including the first gas and the second gas.

8. The method according to claim 7 , wherein said dry-etching of the front surface by the gas mixture includes increasing a rate of the first gas in the gas mixture according to progress of said providing of the recess in the front surface of the substrate.

9. The method according to claim 6 , wherein said dry-etching of the front surface includes dry-etching the front surface by using the first gas and the second gas alternately.

10. The method according to claim 9 , wherein said dry-etching of the front surface by using the first gas and the second gas alternately includes increasing a duration when the recess is provided by the first gas according to progress of said providing of the recess in the front surface of the substrate.

11. The method according to claim 4 , further comprising

dry-etching the substrate by using xenon difluoride.

12. The method according to claim 1 , wherein the adhesive layer is provided on a surface of the element and around the element.

13. The method according to claim 1 , further comprising

picking off the element.

14. The method according to claim 13 , further comprising

mounting the element on a member.

15. The method according to claim 1 , wherein the adhesive layer is provided on a surface of the element and around the element.

16. The method according to claim 1 , wherein the adhesive layer is made of the thermoplastic resin.

17. The method according to claim 1 , further comprising

heating the element.

18. The method according to claim 17 , wherein said heating of the element includes heating the element with a heating iron.

19. The method according to claim 17 , wherein said heating of the element includes allowing the element to be irradiated with infrared ray.

20. The method according to claim 19 , wherein a layer capable of absorbing infrared ray is provided between the dummy substrate and the adhesive layer.

21. The method according to claim 19 , wherein the dummy substrate comprises silicon.

22. The method according to claim 19 , wherein the dummy substrate comprises glass material which can transmit infrared ray.

23. The method according to claim 1 , wherein the adhesive layer comprises resin material having adhesive strength decreased by ultraviolet ray.

24. The method according to claim 23 , further comprising irradiating the adhesive layer with ultraviolet ray.

25. The method according to claim 23 , wherein the dummy substrate comprises material capable of transmitting ultraviolet ray.

26. A method of manufacturing an electronic device comprising:

forming a plurality of elements on a front surface of a substrate;

providing a recess in the front surface of the substrate between the plurality of elements;

removing a portion of the substrate from a back surface of the substrate until reaching the recess;

bonding a dummy substrate to the front surface of the substrate by an adhesive layer comprising thermoplastic resin; and

exposing at least one of the plurality of elements through a mask.

Assignments (8)
CORRECTIVE ASSIGNMENT TO CORRECT THE CONVEYING PARTY'S NAME PREVIOUSLY RECORDED ON REEL 058794 FRAME 0701. ASSIGNOR(S) HEREBY CONFIRMS THE CHANGE OF NAME. Recorded Aug 14, 2023
From: CONVERSANT INTELLECTUAL PROPERTY MANAGEMENT INC.
To: MOSAID TECHNOLOGIES INCORPORATED
Reel/Frame 064584/0672 →
CORRECTIVE ASSIGNMENT TO CORRECT THE CONVEYING PARTY'S NAME FROM CONVERSANT INTELLECTUAL PROPERTY INC. TO CONVERSANT INTELLECTUAL PROPERT MANAGEMENT INC. PREVIOUSLY RECORDED AT REEL: FRAME: . ASSIGNOR(S) HEREBY CONFIRMS THE CHANGE OF NAME. Recorded Aug 7, 2023
From: CONVERSANT INTELLECTUAL PROPERTY MANAGEMENT INC.
To: MOSAID TECHNOLOGIES INCORPORATED
Reel/Frame 064689/0057 →
CHANGE OF NAME Recorded Nov 3, 2021
From: CONVERSANT INTELLECTUAL PROPERTY INC.
To: MOSAID TECHNOLOGIES INCORPORATED
Reel/Frame 058794/0701 →
RELEASE OF SECURITY INTEREST Recorded Nov 6, 2020
From: CPPIB CREDIT INVESTMENTS INC.
To: CONVERSANT INTELLECTUAL PROPERTY MANAGEMENT INC.
Reel/Frame 054344/0143 →
AMENDED AND RESTATED U.S. PATENT SECURITY AGREEMENT (FOR NON-U.S. GRANTORS) Recorded Aug 22, 2018
From: CONVERSANT INTELLECTUAL PROPERTY MANAGEMENT INC.
To: CPPIB CREDIT INVESTMENTS, INC.
Reel/Frame 046900/0136 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded May 10, 2018
From: PANASONIC CORPORATION
To: CONVERSANT INTELLECTUAL PROPERTY MANAGEMENT INC.
Reel/Frame 045773/0387 →
CHANGE OF NAME Recorded Mar 15, 2018
From: MATSUSHITA ELECTRIC INDUSTRIAL CO., LTD.
To: PANASONIC CORPORATION
Reel/Frame 045607/0661 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Oct 3, 2003
From: NAKATANI, MASAYA; HAYASHI, MICHIHIKO; TAJIKA, HIROFUMI
To: MATSUSHITA ELECTRIC INDUSTRIAL CO., LTD.
Reel/Frame 015053/0670 →