IP Library Granted Patent US 8,110,437
Granted Patent B2
US 8,110,437 · App. 10/514,461 · Granted Feb 7, 2012

Method for attaching a semiconductor chip in a plastic encapsulant, optoelectronic semiconductor component and method for the production thereof

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Quick Facts
Patent No.
US 8,110,437
App. No.
10/514,461
Granted
Feb 7, 2012
Kind
B2
Abstract

A radiation-emitting or -receiving semiconductor chip 9 is soft-soldered for mounting on a leadframe 2 over which a prefabricated plastic encapsulant 5 , a so-called premolded package, is injection-molded. Through the use of a low-melting solder 3 applied in a layer thickness of less than 10 μm, the soldering process can be carried out largely without thermal damage to the plastic encapsulant 5.

Claims (51)

1. A method, comprising:

mounting a semiconductor chip on a first surface of a thermally and electrically conductive connector formed entirely of an electrically conductive material and arranged in or on a plastic encapsulant,

wherein the encapsulant comprises a thermoplast material and a filler material and the encapsulant contacts at least a portion of a surface of the connector opposite the first surface;

wherein a connection between the chip and the connector is produced by a soft soldering process using a soft solder material, the soft soldering process taking place at a temperature of between 200° C. inclusive and 260° C. inclusive, and a gold film is deposited on the soft solder material before soldering;

wherein the soft solder material comprises substantially an alloy whose material system has a eutectic composition; and

wherein layers comprising different components of the alloy are applied to said semiconductor chip and/or to said connector.

2. The method of claim 1 , wherein the first surface is a first main surface of the connector and the surface opposite the first surface is a second main surface of the connector.

3. The method of claim 2 , wherein said first and second main surfaces are enveloped by said plastic encapsulant.

4. The method of claim 1 , wherein said plastic encapsulant comprises a duroplast material.

5. The method of claim 1 , wherein said plastic encapsulant is produced by being molded over, particularly injection-molded or compression-molded over, a leadframe and said connector is part of said leadframe.

6. The method of claim 1 , wherein said connector is a metallization layer applied to a plastic encapsulant.

7. The method of claim 1 , wherein said connector is a heat sink embedded in said plastic encapsulant.

8. The method of claim 1 , wherein a solder layer having a thickness of between 1 μm inclusive and 10 μm inclusive is used between said semiconductor chip and said connector.

9. The method of claim 1 , wherein a solder layer having a thickness of between 2 μm inclusive and 5 μm inclusive is used between said semiconductor chip and said connector.

10. The method of claim 1 , wherein the solder material used is composed substantially of pure tin or of an alloy whose principal component is tin.

11. The method of claim 1 , wherein the solder material used is at least one alloy from the group of alloys consisting of AgSn, CuSn, PbSn and InPb or a mixture or layer sequence composed of least two of said alloys.

12. The method of claim 1 , wherein the solder material is applied to said chip before soldering.

13. The method of claim 1 , wherein the solder material is applied to said connector before soldering.

14. The method of claim 1 , wherein said semiconductor chip is attached to said connector with flux before soldering.

15. The method of claim 1 , wherein said semiconductor chip is attached to said connector with solder paste before soldering.

16. The method of claim 1 , wherein a through-type furnace is used for the soldering operation.

17. The method of claim 1 , wherein a heating plate is used for the soldering operation.

18. The method of claim 1 , wherein said plastic encapsulant passes through a washing unit after the soldering process.

19. The method of claim 1 , wherein the filler material further comprises at least one of mineral fillers and TiO 2 .

20. The method of claim 1 , wherein the filler material comprises glass fibers.

21. An optoelectronic semiconductor component, comprising:

a radiation-emitting and/or a radiation-receiving semiconductor chip on a thermally and electrically conductive connector formed entirely of an electrically conductive material and arranged in or on a plastic encapsulant,

wherein the connector comprises a first main surface and a second main surface, the first and second main surfaces being enveloped by the plastic encapsulant;

wherein the plastic encapsulant comprises a thermoplast material and a filler material;

wherein a connecting layer between said semiconductor chip and said connector comprises a soft solder having a composition selected so that the soft solder is configured to undergo a soldering process at a temperature of between 200° C. inclusive and 260° C. inclusive, and a gold film deposited on the soft solder;

wherein the soft solder comprises substantially an alloy whose material system has a eutectic composition; and

wherein the alloy has a composition selected so that layers comprising different components of the alloy are applied to said semiconductor chip and/or to said connector.

22. The optoelectronic semiconductor component of claim 21 , wherein said plastic encapsulant comprises a duroplast material.

23. The optoelectronic semiconductor component of claim 21 , wherein said connector is part of a leadframe that is molded over with said plastic encapsulant, particularly by injection molding or compression molding.

24. The optoelectronic semiconductor component of claim 22 , wherein said connector is a metallization layer applied to said plastic encapsulant.

25. The optoelectronic semiconductor component of claim 22 , wherein said connector is a heat sink embedded in said plastic encapsulant.

26. The optoelectronic semiconductor component of claim 22 , wherein a solder layer having a thickness of between 0.1 μm inclusive and 10 μm inclusive is provided between said semiconductor chip and said connector.

27. The optoelectronic semiconductor component of claim 22 , wherein a solder layer having a thickness of between 0.1 μm inclusive and 5 μm inclusive is provided between said semiconductor chip and said connector.

28. The optoelectronic semiconductor component of claim 21 , wherein said soft solder is composed substantially of pure tin or of an alloy whose principal component is tin.

29. The optoelectronic semiconductor component of claim 22 , wherein said soft solder is substantially an alloy whose material system has a eutectic composition.

30. The optoelectronic semiconductor component of claim 29 , wherein said soft solder is substantially an alloy selected from the group consisting of AgSn, CuSn, PbSn and InPb or a mixture or layer sequence composed of at least two of said alloys.

31. The optoelectronic semiconductor component of claim 22 , wherein said semiconductor chip is attached to said connector in a flip-chip assembly, so that an active epitaxial layer sequence faces said connector.

32. The optoelectronic semiconductor component of claim 31 , wherein said soft solder and a contact layer, particularly a contact metallization of said epitaxial layer sequence, are all that is present between said epitaxial layer sequence and said connector.

33. The optoelectronic semiconductor component of claim 21 , wherein the filler material further comprises at least one of mineral fillers and TiO 2 .

34. The optoelectronic semiconductor component of claim 21 , wherein the filler material comprises glass fibers.

35. A method, comprising:

mounting a semiconductor chip on a first surface of a thermally and electrically conductive connector formed entirely of an electrically conductive material and arranged in or on a plastic encapsulant,

wherein the encapsulant comprises a thermoplast material and a filler material and the encapsulant contacts at least a portion of a surface of the connector opposite the first surface;

wherein a connection between the chip and the connector is produced by a soft soldering process using a soft solder material, the soft soldering process taking place at a temperature of between 200° C. inclusive and 260° C. inclusive;

wherein said semiconductor chip is attached to said connector with flux before soldering; and

wherein said plastic encapsulant passes through a washing unit after the soldering process.

Assignments (2)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jan 3, 2020
From: OSRAM OPTO SEMICONDUCTORS GMBH
To: OSRAM OLED GMBH
Reel/Frame 051467/0906 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Dec 19, 2019
From: OSRAM GMBH
To: OSRAM OPTO SEMICONDUCTORS GMBH
Reel/Frame 051381/0694 →