Method of error compensation in a coordinate measuring machine
A method of calibrating an articulating probe head comprising the steps of measuring an artefact of known dimensions with the workpiece sensing probe mounted on the articulating probe head, in which the articulating probe head is unlocked. An error functional map is generated corresponding to the difference between the measured and known dimensions of the artefact. Subsequent workpieces are measured with the articulating probe head unlocked and the corresponding correction applied. The true dimensions of the artefact may be determined by measuring it with a probe mounted on an articulating probe head in which the axes of the articulating probe head are locked. A mechanical lock is provided to lock the axes of the articulating probe head.
1. A method of calibrating an articulating probe head, the articulating probe head being mounted on an arm of a coordinate positioning apparatus, in which a surface sensing device mounted on the articulating probe head is moved into a position-sensing relationship with an artefact and a position reading taken, the method comprising:
determining true measurements of an artefact by measuring the artefact with no relative movement between the surface sensing device and the arm of the coordinate positioning apparatus;
measuring the artefact whose true measurements have been determined, wherein at least one motor of the articulating probe head is driven to provide relative movement between the surface sensing device and the arm of the coordinate positioning apparatus;
generating an error function or map corresponding to the difference between the measured artefact and the true measurements of the artefact;
measuring subsequent workpieces wherein at least one motor of the articulating probe head is driven to provide relative movement between the surface sensing device and the arm of the coordinate measuring apparatus; and
correcting subsequent workpieces by using the generated error function or map.
2. A method according to claim 1 wherein the step of measuring the artefact when there is no relative movement between the surface sensing device and the arm of the coordinate positioning apparatus is carried out at a slow speed.
3. A method according to claim 1 wherein the artefact comprises a workpiece in the series of workpieces.
4. A method according to claim 1 wherein the artefact has features the size and location of which approximate a workpiece.
5. A method according to claim 4 wherein where the features of the artefact differ from the features of the workpiece, the correction of measurements of subsequent pieces is achieved by interpolation.
6. A method according to claim 1 wherein the arm of the coordinate measuring apparatus is stationary.
7. A method according to claim 1 wherein the arm of the coordinate measuring apparatus is moving at a constant velocity.
8. A method according to claim 1 wherein the measurements comprise continuous measurements.
9. A method according to claim 1 wherein the measurements comprise discrete measurements.
10. A method according to claim 1 wherein the surface sensing device is a contact probe.
11. A method according to claim 1 wherein the surface sensing device is a non-contact probe.
12. A method according to claim 1 wherein a locking mechanism prevents relative movement between the surface sensing device and the arm of the coordinate positioning apparatus.
13. A method according to claim 1 wherein the articulating probe head is provided with at least one motor to rotate the surface sensing device relative to the arm of the coordinate positioning apparatus, and wherein said at least one motor is used to prevent relative movement between the surface sensing device and the arm of the coordinate positioning apparatus.
14. A method according to claim 1 wherein measuring an artefact and measuring subsequent workpieces are carried out at a fast speed.
15. A method according to claim 1 wherein measurement paths used in measuring subsequent workpieces and in determining the true measurements of the artefact are substantially the same.
16. A method of calibrating an articulating probe head, the articulating probe head being mounted to a quill of a coordinate positioning apparatus, in which a surface sensing device mounted on the articulating probe head is moved into a position-sensing relationship with an artefact and a position reading taken, wherein the quill of the coordinate positioning apparatus can be driven along three linear X, Y and Z axes under the action of X, Y and Z drives, the method comprising:
determining true measurements of an artefact;
measuring the artefact whose true measurements have been determined, wherein at least one motor of the articulating probe head is driven to provide relative movement between the surface sensing device and the quill of the coordinate positioning apparatus;
generating an error function or map corresponding to the difference between the measured artefact and the true measurements of the artefact;
measuring subsequent workpieces wherein at least one motor of the articulating probe head is driven to provide relative movement between the surface sensing device and the quill of the coordinate positioning apparatus; and
correcting the measurements of the subsequent workpieces using the generated error function or map.
17. A method according to claim 16 , wherein the true measurements of the artefact are determined by measuring the artefact with no relative movement between the surface sensing device and the quill of the coordinate positioning apparatus.
18. A method of calibrating an articulating probe head, comprising the steps of:
taking an articulating probe head, a surface sensing device, and a coordinate positioning apparatus having a moveable arm, wherein the surface sensing device is attached to the moveable arm via the articulating probe head, wherein the articulating probe head comprises at least one motor for providing relative movement between the surface sensing device and the moveable arm;
moving the surface sensing device into a position-sensing relationship with an artefact and taking a first set of measurement data, wherein the first set of measurement data is taken with the articulating probe head configured such that there is no movement of the surface sensing device relative to the moveable arm of the coordinate positioning apparatus;
moving the surface sensing device into a position-sensing relationship with the artefact and taking a second set of measurement data, wherein the second set of measurement data is taken with the articulating probe head configured such that there is movement of the surface sensing device relative to the moveable arm of the coordinate positioning apparatus; and
comparing the first set of measurement data with the second set of measurement data and generating an error map or function describing the measurement errors caused by the articulating probe head.