IP Library › Granted Patent US 7,615,116
Granted Patent B2
US 7,615,116 · App. 10/572,465 · Granted Nov 10, 2009

Method for producing silicon epitaxial wafer and silicon epitaxial wafer

Assignee: Shin-Etsu Handotai Co., Ltd.
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Quick Facts
Patent No.
US 7,615,116
App. No.
10/572,465
Granted
Nov 10, 2009
Kind
B2
Abstract

In a vapor phase growth apparatus including a reaction chamber, a susceptor, a lift pin, an upper heating device, and a lower heating device, a heating ratio between the upper heating ratio and the lower heating ratio is adjusted.

Claims (10)

1. A method for producing a silicon epitaxial wafer that uses a vapor phase deposition apparatus, the vapor phase deposition apparatus comprising:

a reaction chamber;

a susceptor within the reaction chamber on which a silicon wafer is mounted;

a lift pin vertically movable relative to the susceptor that allows the silicon wafer to be mounted on and removed from the susceptor when the lift pin is vertically moved to support the silicon wafer from a lower surface side of the silicon wafer;

an upper heating member for heating the susceptor from an upper side; and

a lower heating member for heating the susceptor from a lower side; the method comprising:

growing a silicon epitaxial layer by vapor phase growth on a main surface of the silicon wafer;

wherein:

a heating ratio of the upper heating member to the lower heating member is about 44-48% to about 52-56%; and

the heating ratio controls a surface shape of the silicon epitaxial layer formed near the lift pin on the main surface of the silicon wafer.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Mar 20, 2006
From: KANAYA, KOICHI; NISHIZAWA, TSUYOSHI
To: SHIN-ETSU HANDOTAI CO., LTD.
Reel/Frame 017686/0431 →
Priority Claims (1)
JP 2003-342943 · Oct 1, 2003 · national
Continuity (1)
Related Publication 20070119367A1 · May 31, 2007