Radiation detector with controlled spectral sensitivity distribution
View Patent ↗The invention concerns a radiation detector for detecting radiation having a defined spectral sensitivity distribution ( 14 ) that exhibits a sensitivity maximum at a defined wavelength λ 0 , wherein the radiation detector preferably contains a III-V semiconductor material and particularly preferably comprises at least one semiconductor chip ( 1 ) and at least one optical filter disposed after the semiconductor chip, the semiconductor chip containing at least one III-V semiconductor material and the optical filter absorbing radiation of a wavelength that is greater than the wavelength λ 0 of the sensitivity maximum.
1. A radiation detector for detecting incident radiation according to a predetermined spectral sensitivity distribution having a sensitivity maximum at a predetermined wavelength λ 0 , said radiation detector comprising at least one semiconductor chip and at least one optical filter, wherein
the at least one semiconductor chip comprises at least one III-V semiconductor material;
the at least one optical filter is disposed outside the at least one semiconductor chip, and the at least one optical filter is configured to receive the incident radiation, to absorb a portion of the incident radiation having a wavelength that is greater than the wavelength λ 0 of the sensitivity maximum, and to transmit filtered radiation to the at least one semiconductor chip; and
the radiation detector has a detector sensitivity such that at an arbitrary wavelength, a difference between corresponding values of the detector sensitivity and the predetermined spectral sensitivity distribution is less than 40%.
2. The radiation detector of claim 1 , wherein the predetermined spectral sensitivity distribution is a standard sensitivity distribution of a human eye.
3. The radiation detector of claim 1 , wherein the at least one semiconductor chip comprises a layer structure that corresponds to a layer structure of a light emitting diode.
4. The radiation detector of claim 1 , wherein a sensitivity distribution of the at least one semiconductor chip exhibits at least one maximum at a wavelength λ 1 , and wherein a difference between λ 1 and λ 0 is 50 nm or less.
5. The radiation detector of claim 4 , wherein the difference between λ 1 and λ 0 is 15 nm or less.
6. The radiation detector of claim 1 , wherein the at least one semiconductor chip comprises a filter layer.
7. The radiation detector of claim 6 , wherein the filter layer absorbs radiation having a wavelength that is smaller than λ 0 .
8. The radiation detector of claim 1 , wherein the at least one III-V semiconductor material is In x Ga y Al 1-x-y P, In x Ga y Al 1-x-y N, or In x Ga y Al 1-x-y As, and wherein 0≦x≦1, 0≦y≦1 and x+y≦1 for the at least one semiconductor material.
9. A radiation detector comprising at least one semiconductor chip and operative to detect incident radiation according to a standard spectral sensitivity distribution of a human eye,
wherein the at least one semiconductor chip comprises at least one III-V semiconductor material; and
wherein the radiation detector has a detector sensitivity such that at an arbitrary wavelength, a difference between corresponding values of the detector sensitivity and the standard spectral sensitivity distribution of a human eye is less than 40%.
10. The radiation detector of claim 9 , further comprising at least one optical filter that is disposed outside the at least one semiconductor chip, wherein the at least one optical filter is configured to receive the incident radiation, to absorb a portion of the incident radiation having a wavelength that is greater than a wavelength λ 0 ′ of a sensitivity maximum of the human eye, and to transmit filtered radiation to the at least one semiconductor chip.
11. The radiation detector of claim 10 , wherein the at least one optical filter comprises a plurality of filter particles.
12. The radiation detector of claim 9 , wherein the at least one semiconductor chip comprises a layer structure that corresponds to a layer structure of a light emitting diode.
13. The radiation detector of claim 12 , wherein the at least one semiconductor chip comprises a layer structure configured so that if the at least one semiconductor chip is operated to emit light, a central emission wavelength of the emitted light is in an infrared region of the spectrum.
14. The radiation detector of claim 9 , wherein a sensitivity distribution of the at least one semiconductor chip exhibits at least one maximum at a wavelength λ 1 , and wherein a difference between λ 1 and λ 0 ′ is 50 nm or less.
15. The radiation detector of claim 14 , wherein the difference between λ 1 and λ 0 ′ is 15 nm or less.
16. The radiation detector of claim 9 , wherein the detector comprises an encapsulation that at least partially surrounds said at least one semiconductor chip.
17. The radiation detector of claim 16 , wherein the encapsulation comprises a resin, preferably a reaction resin.
18. The radiation detector of claim 16 , further comprising at least one optical filter that is disposed outside the at least one semiconductor chip,
wherein the at least one optical filter is configured to receive the incident radiation, to absorb a portion of the incident radiation having a wavelength that is greater than a wavelength λ 0 ′ of a sensitivity maximum of the human eye, and to transmit filtered radiation to the at least one semiconductor chip, and
wherein the at least one optical filter is disposed at least partially inside, outside and/or on the encapsulation and/or the encapsulation forms the at least one optical filter.
19. The radiation detector of claim 9 , wherein the at least one semiconductor chip comprises a filter layer.
20. The radiation detector of claim 19 , wherein the filter layer absorbs radiation having a wavelength that is smaller than λ 0 ′.
21. The radiation detector of claim 19 , wherein the filter layer extends over an entire face of the at least one semiconductor chip.
22. The radiation detector of claim 9 , wherein the at least one III-V semiconductor material is In x Ga y Al 1-x-y P, and wherein 0≦x≦1, 0≦y≦1 and x+y≦1.
23. The radiation detector of claim 9 , wherein the difference between corresponding values of the detector sensitivity and the standard spectral sensitivity distribution of the human eye is less than 25%.
24. The radiation detector of claim 9 , wherein the radiation detector is configured for use as an environmental light sensor.
25. A radiation detector for detecting incident radiation according to a predetermined spectral sensitivity distribution having a sensitivity maximum at a predetermined wavelength λ 0 , the detector comprising:
at least one semiconductor chip comprising a filter layer and at least one III-V semiconductor material; and
at least one optical filter disposed outside the at least one semiconductor chip,
wherein the at least one optical filter is configured to receive the incident radiation, to absorb a portion of the incident radiation having a wavelength that is greater than the wavelength λ 0 of the sensitivity maximum, and to transmit filtered radiation to the at least one semiconductor chip; and
wherein the radiation detector has a detector sensitivity such that at an arbitrary wavelength, a difference between corresponding values of the detector sensitivity and the predetermined spectral sensitivity distribution is less than 40%.