IP Library Granted Patent US 7,378,913
Granted Patent B2
US 7,378,913 · App. 10/579,949 · Granted May 27, 2008

Optically excited atomic frequency standard

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Quick Facts
Patent No.
US 7,378,913
App. No.
10/579,949
Granted
May 27, 2008
Kind
B2
Abstract

An optically-excited atomic frequency standard that subjects alkali metal atoms ( 111 ) to circularly-polarized optical radiation. The atomic frequency standard is improved by the use of a circular polarizer ( 202 ) to control the intensity of the circularly-polarized optical radiation. The circular polarizer includes a linear polarizer ( 203 ) and a quarter-wave retarder ( 205 ), with the light to be circularly polarized passing first through the linear polarizer ( 203 ) and then through the quarter-wave retarder ( 205 ). In the atomic frequency standard, the optical radiation ( 105 ) to which the circular polarizer ( 202 ) is applied is itself linearly polarized, and the intensity of the circularly polarized light produced by the circular polarizer ( 202 ) is controlled by rotating ( 303 ) the circular polarizer. The degree of rotation determines how much of the linearly-polarized optical radiation passes through the linear polarizer, and thus how much circularly-polarized light is produced.

Claims (26)

1. An improved frequency standard of the type wherein a beam of circularly-polarized light passes through an alkali vapor resonance cell,

the improved frequency standard being characterized in that:

the beam of circularly-polarized light is produced by passing a beam of linearly-polarized light through a circular polarizer, the circular polarizer being rotatable around an axis that is parallel to the beam of light, the circular polarizer includes a linear polarizer and a quarter wave retarder,

whereby the intensity of the circularly-polarized beam is controlled by rotating the circular polarizer

wherein during rotation, an axis of polarization of the linear polarizer and a fast axis of the quarter wave retarder have a fixed orientation to each other,

wherein the linear polarizer and the quarter wave retarder are rotated as a unit.

2. The improved frequency standard set forth in claim 1 further characterized in that:

the beam of linearly-polarized light is produced by a laser.

3. The improved frequency standard set forth in claim 1 further characterized in that:

the beam of linearly-polarized light is produced by a second linear polarizer.

4. The improved frequency standard set forth in claim 1 wherein:

during rotation, the linear polarizer and the quarter wave retarder are oriented to each other such that the conversion of light which reaches the quarter wave retarder to circular polarization is maximized.

5. The improved frequency standard set forth in claim 4 wherein:

the axis of polarization of the linear polarizer and the fast axis of the quarter wave retarder are oriented to each other at an angle of 45°.

6. A method employed in a frequency standard of the type wherein a beam of circularly-polarized light passes through an alkali vapor resonance cell to control the intensity of the beam of circularly-polarized light the circularly-polarized light being produced by passing a linearly polarized beam of light through a circular polarizer, the circular polarizer being rotatable about an axis that is parallel to the beam of light, and

the method comprising the steps of:

rotating the circular polarizer, the circular polarizer including a linear polarizer and a quarter wave retarder,

wherein during rotation, an axis of polarization of the linear polarizer and a fast axis of the quarter wave retarder have a fixed orientation to each other,

wherein the linear polarizer and the quarter wave retarder are rotated as a unit; and

determining the intensity of the beam,

the steps being repeated until a desired intensity has been obtained.

7. The method set forth in claim 6 further comprising the step of:

preventing further rotation of the circular polarizer after the desired intensity has been obtained.

8. The method set forth in claim 6 wherein:

the beam of circularly polarized light strikes a device which measures the intensity of the beam; and

the steps of the method are automatically performed in response to changes in the intensity of the beam as measured by the device.

Assignments (4)
RELEASE OF SECURITY INTEREST Recorded Jan 19, 2016
From: BANK OF AMERICA, N.A.
To: MICROSEMI CORPORATION; MICROSEMI CORP.-ANALOG MIXED SIGNAL GROUP, A DELAWARE CORPORATION; MICROSEMI SOC CORP., A CALIFORNIA CORPORATION; MICROSEMI SEMICONDUCTOR (U.S.) INC., A DELAWARE CORPORATION; MICROSEMI FREQUENCY AND TIME CORPORATION, A DELAWARE CORPORATION; MICROSEMI COMMUNICATIONS, INC. (F/K/A VITESSE SEMICONDUCTOR CORPORATION), A DELAWARE CORPORATION; MICROSEMI CORP.-MEMORY AND STORAGE SOLUTIONS (F/K/A WHITE ELECTRONIC DESIGNS CORPORATION), AN INDIANA CORPORATION
Reel/Frame 037558/0711 →
SECURITY AGREEMENT Recorded Apr 22, 2015
From: MICROSEMI CORPORATION; MICROSEMI CORP.-ANALOG MIXED SIGNAL GROUP; MICROSEMI SEMICONDUCTOR (U.S.) INC.; MICROSEMI SOC CORP.; MICROSEMI FREQUENCY AND TIME CORPORATION
To: BANK OF AMERICA, N.A., AS COLLATERAL AGENT
Reel/Frame 035477/0057 →
CHANGE OF NAME Recorded Feb 13, 2014
From: SYMMETRICOM, INC.
To: MICROSEMI FREQUENCY AND TIME CORPORATION
Reel/Frame 032264/0195 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Dec 21, 2012
From: KERNCO, INC.
To: SYMMETRICOM, INC.
Reel/Frame 029519/0231 →